Cross-Correlation between Strain, Ferroelectricity, and Ferromagnetism in Epitaxial Multiferroic CoFe2O4/BaTiO3 Heterostructures.

Multiferroic biphase systems with robust ferromagnetic and ferroelectric response at room temperature would be ideally suitable for voltage-controlled nonvolatile memories. Understanding the role of strain and charges at interfaces is central for an accurate control of the ferroelectricity as well as of the ferromagnetism. In this paper, we probe the relationship between the strain and the ferromagnetic/ferroelectric properties in the layered CoFe2O4/BaTiO3 (CFO/BTO) model system. For this purpose, ultrathin epitaxial bilayers, ranging from highly strained to fully relaxed, were grown by molecular beam epitaxy on Nb:SrTiO3(001). The lattice characteristics, determined by X-ray diffraction, evidence a non-intuitive cross-correlation: the strain in the bottom BTO layer depends on the thickness of the top CFO layer and vice versa. Plastic deformation participates in the relaxation process through dislocations at both interfaces, revealed by electron microscopy. Importantly, the switching of the BTO ferroelectric polarization, probed by piezoresponse force microscopy, is found dependent on the CFO thickness: the larger is the latter, the easiest is the BTO switching. In the thinnest thickness regime, the tetragonality of BTO and CFO has a strong impact on the 3d electronic levels of the different cations, which were probed by X-ray linear dichroism. The quantitative determination of the nature and repartition of the magnetic ions in CFO, as well as of their magnetic moments, has been carried out by X-ray magnetic circular dichroism, with the support of multiplet calculations. While bulklike ferrimagnetism is found for 5-15 nm thick CFO layers with a magnetization resulting as expected from the Co2+ ions alone, important changes occur at the interface with BTO over a thickness of 2-3 nm because of the formation of Fe2+ and Co3+ ions. This oxidoreduction process at the interface has strong implications concerning the mechanisms of polarity compensation and coupling in multiferroic heterostructures.

Crystal Growth and Characterization of HgBa2Ca2Cu3O8+δ Superconductors with the Highest Critical Temperature at Ambient Pressure.

We report an original procedure for the elaboration of very high-quality single crystals of superconducting HgBa2Ca2Cu3O8+δ mercury cuprates. These single crystals are unique, with very high-quality surface paving the way for spectroscopic, transport, and thermodynamic probes in order to understand the hole-doped cuprate phase diagram. Annealing allows one to optimize Tc up to Tcmax = 133 K. The superconductivity transition width of about 2 K indicates that they are homogeneous. We show for the first time that, with adequate heat treatment, Hg-1223 can be largely underdoped and its doping level controlled. Importantly, the crystal structure was studied in detail by single-crystal X-ray diffraction, and we have identified the signature of the underdoping by a detailed sample characterization and micro-Raman spectroscopy measurements.

Engineering the magnetic coupling and anisotropy at the molecule-magnetic surface interface in molecular spintronic devices.

A challenge in molecular spintronics is to control the magnetic coupling between magnetic molecules and magnetic electrodes to build efficient devices. Here we show that the nature of the magnetic ion of anchored metal complexes highly impacts the exchange coupling of the molecules with magnetic substrates. Surface anchoring alters the magnetic anisotropy of the cobalt(II)-containing complex (Co(Pyipa)2), and results in blocking of its magnetization due to the presence of a magnetic hysteresis loop. In contrast, no hysteresis loop is observed in the isostructural nickel(II)-containing complex (Ni(Pyipa)2). Through XMCD experiments and theoretical calculations we find that Co(Pyipa)2 is strongly ferromagnetically coupled to the surface, while Ni(Pyipa)2 is either not coupled or weakly antiferromagnetically coupled to the substrate. These results highlight the importance of the synergistic effect that the electronic structure of a metal ion and the organic ligands has on the exchange interaction and anisotropy occurring at the molecule-electrode interface.

Widely tunable two-colour seeded free-electron laser source for resonant-pump resonant-probe magnetic scattering.

The advent of free-electron laser (FEL) sources delivering two synchronized pulses of different wavelengths (or colours) has made available a whole range of novel pump-probe experiments. This communication describes a major step forward using a new configuration of the FERMI FEL-seeded source to deliver two pulses with different wavelengths, each tunable independently over a broad spectral range with adjustable time delay. The FEL scheme makes use of two seed laser beams of different wavelengths and of a split radiator section to generate two extreme ultraviolet pulses from distinct portions of the same electron bunch. The tunability range of this new two-colour source meets the requirements of double-resonant FEL pump/FEL probe time-resolved studies. We demonstrate its performance in a proof-of-principle magnetic scattering experiment in Fe-Ni compounds, by tuning the FEL wavelengths to the Fe and Ni 3p resonances.

X-ray diffraction imaging of metal-oxide epitaxial tunnel junctions made by optical lithography: use of focused and unfocused X-ray beams.

X-ray diffraction techniques are used in imaging mode in order to characterize micrometre-sized objects. The samples used as models are metal-oxide tunnel junctions made by optical lithography, with lateral sizes ranging from 150 µm down to 10 µm and various shapes: discs, squares and rectangles. Two approaches are described and compared, both using diffraction contrast: full-field imaging (topography) and raster imaging (scanning probe) using a micrometre-sized focused X-ray beam. It is shown that the full-field image gives access to macroscopic distortions (e.g. sample bending), while the local distortions, at the micrometre scale (e.g. tilts of the crystalline planes in the vicinity of the junction edges), can be accurately characterized only using focused X-ray beams. These local defects are dependent on the junction shape and larger by one order of magnitude than the macroscopic curvature of the sample.