Extension and Limits of Depolarization-Fringe Contrast Roughness Method in Sub-Micron Domain.

To guarantee quality standards for the industry, surface properties, particularly those of roughness, must be considered in many areas of application. Today, several methods are available on the market, but some damage the surface to be tested as they measure it by contact. A non-contact method for the precise estimation of sub-micron roughness values is presented, which can be used as an extension of existing roughness measurement techniques to improve them further considering the depolarized light reflected by the sample. This setup is based on a Michelson interferometer, and by introducing a quarter-wave plate on a half part of the reference mirror, the surface roughness can be directly derived by measuring the fringe contrasts. This article introduces a simple model describing the intensity distortions resulting from the microscopic roughness in divided interferograms when considering depolarization. This work aimed to extend the measurement range of the technique developed in a previous work, in which depolarization effects are taken into account. For verification, the experimental results were compared with the fringe contrast technique, which does not consider the depolarization of the scattered light, especially regarding the extended wavelength interval, highlighting the limits of the technique. In addition, simulations of the experiments are presented. For comparison, the reference values of the sample roughness were also generated by measurements with a stylus profiler.

Shear-unlimited common-path speckle interferometer.

A single-aperture common-path speckle interferometer with an unlimited shear amount is developed. This unlimited shear amount is introduced when a Wollaston prism is placed near the Fourier plane of a common-path interferometer, which is built by using a quasi-${4f}$4f imaging system. The fundamentals of the shear amount and the spatial carrier frequency generation are analyzed mathematically, and the theoretical predictions are validated by a static experiment. Mode-I fracture experiments through the three-point bending are conducted to prove the feasibility and the capability of this method in full-field strain measurement with various shear amounts. A remarkable feature of this setup is that no tilt is required between the optical components to produce the unlimited shear amount in off-axis holography.

Non-Contact Roughness Measurement in Sub-Micron Range by Considering Depolarization Effects.

The characteristics of a surface, particularly the roughness, play an important role in different fields of the industry and have to be considered to ensure quality standards. Currently, there are numerous sophisticated methods for measuring surface roughness but plenty of them cause long-term damage because they are in contact with the sample. This article presents a non-contact method to accurately determine small surface roughnesses resulting from the consideration of the depolarization effects caused by the rough surface. This technique can be applied as an extension in various roughness measurements and improves the approach of Chandley's technique, which does not take into account the depolarization of the light scattered by the sample. The experimental setup and the measurements are easy to perform. The essential component is a quarter wave plate, which is incorporated into a Michelson interferometer. With the resulting two different contrasts and the recorded intensities of the sample and the reference mirror, the surface roughness can be estimated straightforwardly. This article details the theoretical approach, followed by the experimental results and the corresponding uncertainties. The experimental results are compared with Chandley's method. In order to have reference roughness values of the samples, measurements with a stylus profilometer and with a confocal microscope are performed and compared.

Real-time dual-sensitive shearography for simultaneous in-plane and out-of-plane strain measurements.

A real-time, dual-sensitive shearography system using a single-wavelength laser was developed for simultaneous and dynamic in-plane and out-of-plane strain measurements. The shearography system is capable of measuring crack-tip deformation fields quantitatively. A spatial multiplexing technique based on Fourier transform is employed for simultaneous and dynamic multi-component phase retrieval. Two slit spatial filters and a common-path shearing interferometer are used to obtain an improved phase quality for crack-tip deformation measurements. Mode-I fracture experiments under three-point bending were conducted to validate the feasibility and the capability of this method.

Dual-directional shearography based on a modified common-path configuration using spatial phase shift.

This paper describes a dual-directional shearography system to address the issue of two-dimensional characterization of the surface strain. A common-path configuration coupled with an additional light path is used to provide the shearing in two directions. One of the three interfering beams is shared by both directional shearograms to improve the light efficiency and enhance the robustness of the system. The two directional shearograms are carried by different spatial carriers to distinguish one from the other. The spatial carrier is introduced by the single-aperture-lens Wollaston prism configuration. Rather than the conventional method in which the aperture is fixed at the front focal point of the imaging lens, a general case is considered by introducing a variable distance between the aperture and the imaging lens. The influence of the aperture-lens distance on the spatial carrier is then analyzed, which enables the separate control of the shearing amount and the spatial carrier. Two types of dual-directional shearography are presented to demonstrate the feasibility and the flexibility of the system. Type I is the simultaneous dual lateral shearography in orthogonal directions, and Type II is the simultaneous lateral and radial shearography. The spatial carrier introduced by the single-aperture-lens Wollaston prism configuration is discussed, and a configuration in which the Wollaston prism and the aperture are located at different sides of the lens is recommended for further shearography applications.