RESUMO
A compact, ultra-broadband and high-performance silicon TE-pass polarizer is proposed and demonstrated experimentally. It is based on partially-etched (ridge) waveguide adiabatic S-bends, input/output tapers and side gratings on a silicon-on-insulator (SOI) platform. A compact footprint and weak back reflections are obtained due to the bent waveguide and the tapers, respectively. An extremely high extinction ratio is achieved by scattering the undesired light in the slab section using the side gratings. The 3D FDTD simulations show a TE loss less than 0.3 dB and an extinction ratio greater than 30 dB over a 500 nm wavelength range (1200 nm to 1700 nm). Measured results show a high TM loss (> 35 dB) and a low TE insertion loss (< 1.5 dB), over a 200 nm wavelength range (1450 nm to 1650 nm). The measured TE loss is < 0.6 dB at a communication wavelength of 1550 nm. The footprint of the optimized design is 65 µm × 20 µm.
RESUMO
Luminescence is one of the most important characterisation tools of semiconductor materials and devices. Recently, a very efficient analytical set of equations has been applied to explain optical properties of dilute semiconductor materials, with an emphasis on the evolution of peak luminescence gain with temperature and its relation to sample quality. This paper summarizes important steps of the derivation of these expressions that have not been presented before and delivers a theoretical framework that can used to apply exactly solvable Hamiltonians for realistic studies of luminescence in various systems.
