Application of self-supervised approaches to the classification of X-ray diffraction spectra during phase transitions.

Spectroscopy and X-ray diffraction techniques encode ample information on investigated samples. The ability of rapidly and accurately extracting these enhances the means to steer the experiment, as well as the understanding of the underlying processes governing the experiment. It improves the efficiency of the experiment, and maximizes the scientific outcome. To address this, we introduce and validate three frameworks based on self-supervised learning which are capable of classifying 1D spectral curves using data transformations preserving the scientific content and only a small amount of data labeled by domain experts. In particular, in this work we focus on the identification of phase transitions in samples investigated by x-ray powder diffraction. We demonstrate that the three frameworks, based either on relational reasoning, contrastive learning, or a combination of the two, are capable of accurately identifying phase transitions. Furthermore, we discuss in detail the selection of data augmentation techniques, crucial to ensure that scientifically meaningful information is retained.

A von Hámos spectrometer for diamond anvil cell experiments at the High Energy Density Instrument of the European X-ray Free-Electron Laser.

A von Hámos spectrometer has been implemented in the vacuum interaction chamber 1 of the High Energy Density instrument at the European X-ray Free-Electron Laser facility. This setup is dedicated, but not necessarily limited, to X-ray spectroscopy measurements of samples exposed to static compression using a diamond anvil cell. Si and Ge analyser crystals with different orientations are available for this setup, covering the hard X-ray energy regime with a sub-eV energy resolution. The setup was commissioned by measuring various emission spectra of free-standing metal foils and oxide samples in the energy range between 6 and 11 keV as well as low momentum-transfer inelastic X-ray scattering from a diamond sample. Its capabilities to study samples at extreme pressures and temperatures have been demonstrated by measuring the electronic spin-state changes of (Fe0.5Mg0.5)O, contained in a diamond anvil cell and pressurized to 100 GPa, via monitoring the Fe Kß fluorescence with a set of four Si(531) analyser crystals at close to melting temperatures. The efficiency and signal-to-noise ratio of the spectrometer enables valence-to-core emission signals to be studied and single pulse X-ray emission from samples in a diamond anvil cell to be measured, opening new perspectives for spectroscopy in extreme conditions research.