1.
Appl Opt
; 45(12): 2773-6, 2006 Apr 20.
Artigo
em Inglês
| MEDLINE
| ID: mdl-16633429
RESUMO
The theoretical investigation of the off-axis z-scan technique for the measurement of nonlinear optical refraction in materials is presented. The normalized transmittance is calculated for different aperture radii and positions. The dependence of both the normalized transmittance amplitude (DeltaT(pv)) and the distance between maximum and minimum (Deltaz(pv)) on the aperture radius is analyzed. A condition for the applicability of the pinhole approximation is given.