Ultraviolet Lasers Realized via Electrostatic Doping Method.

P-type doping of wide-bandgap semiconductors has long been a challenging issue for the relatively large activation energy and strong compensation of acceptor states in these materials, which hinders their applications in ultraviolet (UV) optoelectronic devices drastically. Here we show that by employing electrostatic doping method, hole-dominant region can be formed in wide bandgap semiconductors, and UV lasing has been achieved through the external injection of electrons into the hole-dominant region, confirming the applicability of the p-type wide bandgap semiconductors realized via the electrostatic doping method in optoelectronic devices.

p-type doping of MgZnO films and their applications in optoelectronic devices.

A lithium and nitrogen codoping method has been employed to prepare p-type MgZnO films, and p-MgZnO/i-ZnO/n-ZnO structured light-emitting devices (LEDs) and photodetectors have been fabricated. The LEDs can work continuously for about 97 h under the injection of a 20 mA continuous current, which is the best value ever reported for ZnO-based LEDs. The performance of the photodetectors degrades little after several running cycles. The above results reveal the applicability of the p-MgZnO films in optoelectronic devices.

High gain Ga2O3 solar-blind photodetectors realized via a carrier multiplication process.

Ga2O3 photodetectors with interdigitated electrodes have been designed and fabricated, and the Ga2O3 area exposed to illumination acts as the active layer of the photodetector, while the area covered by Au interdigital electrode provide an arena for carrier multiplication. The photodetectors show a maximum responsivity at around 255 nm and a cutoff wavelength of 260 nm, which lies in the solar-blind region. The responsivity of the photodetector reaches 17 A/W when the bias voltage is 20 V, which corresponds to a quantum efficiency of 8228%, amongst the best value ever reported in Ga2O3 film based solar-blind photodetectors.

Dominant factor determining the conduction-type of nitrogen-doped ZnO film.

Nitrogen-doped zinc oxide (ZnO) film has been grown by molecular beam epitaxy. The as-grown sample showed p-type conduction with a hole concentration of 3.1 x 10(17) cm(-3). After an annealing process in O2 at 600 degrees C for 30 min, p-type conduction was still remained, and the hole concentration of the film decreased to 6.8 x 10(16) cm(-3). Secondary ion mass spectroscopy revealed that the concentration of both nitrogen and hydrogen decreased after the annealing process. It is demonstrated that the intrinsic compensation source has been decreased after the annealing process. Because the variation trend of the hole concentration in the ZnO:N film is opposite to that of hydrogen and intrinsic defects, but in good accordance with nitrogen, the extrinsically substituted nitrogen (N(o)) should be the dominant factor that determines the conduction-type of the ZnO:N film.

Ultraviolet emissions excited by accelerated electrons.

By employing an insulating zinc oxide (i-ZnO) as an electron accelerating layer, and an n-type ZnO as an active layer, ultraviolet (UV) emissions at 385 nm caused by the excitation of the n-ZnO layer by the accelerated electrons from the i-ZnO layer have been realized. By replacing the active layer with larger bandgap Mg0.39Zn0.61O and properly optimizing the structure, shorter wavelength emissions at around 328 nm have been obtained. Considering that the p-type doping of wide bandgap semiconductors is still a challenging issue, the results reported in this Letter may provide a promising alternative route to UV emissions.

A reproducible route to p-ZnO films and their application in light-emitting devices.

Although great efforts have been made, reproducible p-type doping is still one of the largest hurdles that hinders the optoelectronic applications of ZnO. In this Letter, a reproducible route to p-type ZnO films employing lithium-nitrogen as a dual-acceptor dopant has been demonstrated, and p-i-n structured light-emitting devices (LEDs) have been constructed. Obvious purple emissions have been observed from the LEDs, confirming the applicability of the p-type ZnO films in optoelectronic devices. The results reported in this Letter provide a reproducible route to p-type ZnO films, and thus may lay a solid ground for future optoelectronic applications of ZnO.

Optical properties of ZnMgO nanowalls grown by plasma-assisted molecular beam epitaxy.

ZnMgO nanowalls were prepared by plasma-assisted molecular beam epitaxy without a catalyst on c-Al2O3 substrate. The obtained nanowalls have preferred orientation along c axis. The nanowalls are about 10 to 20 nm in thickness and about 50 nm in height. Only Zn, Mg, O and Al signals are detected in the nanowalls from the energy dispersive spectroscopy (EDS). The Mg content is about 3% in ZnMgO nanowalls. The room temperature photoluminescence (PL) spectra shows the emission peak of the ZnMgO nanowalls at 3.346 eV. The origin of the ultraviolet emission is discussed with the help of temperature-dependent PL spectra. The ultraviolet emission band is free exiton recombination observed in the low temperature PL spectra (at 81 K). We also observe the free-to-acceptor (FA) emission of the ZnMgO nanowalls. The acceptor binding energy obtained from photoluminescence studies is about 123 meV. The results show that Mg doping leads to an increase of the acceptor binding energy. The possible growth mechanism of the ZnMgO nanowall networks was discussed.

Doped ZnO nanowires obtained by thermal annealing.

Doped ZnO nanowires were prepared in a very simple and inexpensive thermal annealing method using ZnSe nanowires as a precursor. As doped, P doped, and As/P codoped ZnO nanowires were obtained in this method. X-ray diffraction shows that the zincblende ZnSe nanowires were converted to doped wurtzite ZnO nanowires. The incorporation of the dopants was confirmed by energy dispersive X-ray spectroscopy. The doping concentration could be adjusted by changing the annealing temperature and duration. Scanning electron microscopy indicated that the morphology of the ZnSe nanowires was essentially retained after the annealing and doping process. Photoluminescence spectroscopy also verified the incorporation of the dopants into the nanowires.

A simple route to porous ZnO and ZnCdO nanowires.

Porous ZnO nanowires were obtained in an inexpensive and simple way by thermally oxidizing ZnSe nanowires in air. The morphologies of the precursor and resulted nanowires are almost identical. X-ray diffraction and energy-dispersive X-ray spectroscopy reveal that the zinc blende ZnSe nanowires were transformed into wurtzite ZnO nanowires after oxidation. Transmission electron microscope measurements indicate that the ZnO nanowires are polycrystalline and are composed of nanoparticles and nanopores. ZnCdO nanowires, which were seldom reported previously, have also been prepared in this way. Just like the ZnO nanowires, the ZnCdO nanowires also show the porous structure. Photoluminescence studies on both ZnO and ZnCdO nanowires show intense near-band edge emissions at room temperature. The transition from one kind of nanowires to another by simple thermal oxidization described in this paper may be applicable to some other compound semiconductors and may open a practical route to yield nanowires.

Wurtzite ZnSe nanowires: growth, photoluminescence, and single-wire Raman properties.

Wurtzite ZnSe nanowires were prepared on GaAs substrates in a metal-organic chemical vapour deposition system. Electron microscopy shows that they are smooth and uniform in size. Both transmission electron microscopy and x-ray diffraction reveal the wurtzite structure of the nanowires, which grows along the [Formula: see text] direction. Raman scattering studies on individual nanowires were performed in the back-scattering geometry at room temperature. Besides the commonly observed longitudinal and transverse optical phonon modes, a possible surface mode located at 233 cm(-1) is also observed in the Raman spectrum. A peak located at 2.841 eV was clearly observed in the photoluminescence spectra of the nanowires, which can be assigned to near band edge emissions of wurtzite ZnSe.