Ultra-precise determination of thicknesses and refractive indices of optically thick dispersive materials by dual-comb spectroscopy.

Precise measurements of the geometrical thickness of a sample and its refractive index are important for materials science, engineering, and medical diagnosis. Among the possible non-contact evaluation methods, optical interferometric techniques possess the potential of providing superior resolution. However, in the optical frequency region, the ambiguity in the absolute phase-shift makes it difficult to measure these parameters of optically thick dispersive materials with sufficient resolution. Here, we demonstrate that dual frequency-comb spectroscopy can be used to precisely determine the absolute sample-induced phase-shift by analyzing the data smoothness. This method enables simultaneous determination of the geometrical thickness and the refractive index of a planar sample with a precision of five and a half digits. The thickness and the refractive index at 193.414 THz (λ = 1550 nm) of a silicon wafer determined by this method are 0.5204737(19) mm and 3.475625(58), respectively, without any prior knowledge of the refractive index.

Polarization-sensitive dual-comb spectroscopy with an electro-optic modulator for determination of anisotropic optical responses of materials.

We propose and demonstrate a polarization-sensitive dual-comb spectroscopy (DCS) technique that employs an electro-optic modulator for determining the anisotropic optical responses of materials. This straightforward extension of the typical DCS setup directly provides amplitudes and phases in two mutually orthogonal directions of the electric field of light. Using this method, we determined the optic axis direction and the anisotropy in the complex refractive index of a sample whose optical parameter is well defined. We estimate a birefringence of the sample to be 5.49(55)×10-5 at a comb tooth in the 780 nm region.