Bright focused ion beam sources based on laser-cooled atoms.

Nanoscale focused ion beams (FIBs) represent one of the most useful tools in nanotechnology, enabling nanofabrication via milling and gas-assisted deposition, microscopy and microanalysis, and selective, spatially resolved doping of materials. Recently, a new type of FIB source has emerged, which uses ionization of laser cooled neutral atoms to produce the ion beam. The extremely cold temperatures attainable with laser cooling (in the range of 100 µK or below) result in a beam of ions with a very small transverse velocity distribution. This corresponds to a source with extremely high brightness that rivals or may even exceed the brightness of the industry standard Ga+ liquid metal ion source. In this review we discuss the context of ion beam technology in which these new ion sources can play a role, their principles of operation, and some examples of recent demonstrations. The field is relatively new, so only a few applications have been demonstrated, most notably low energy ion microscopy with Li ions. Nevertheless, a number of promising new approaches have been proposed and/or demonstrated, suggesting that a rapid evolution of this type of source is likely in the near future.

Electronic detection of collective modes of an ultracold plasma.

Using a new technique to directly detect current induced on a nearby electrode, we measure plasma oscillations in ultracold plasmas, which are influenced by the inhomogeneous and time-varying density and changing neutrality. Electronic detection avoids heating and evaporation dynamics associated with previous measurements and allows us to test the importance of the plasma neutrality. We apply dc and pulsed electric fields to control the electron loss rate and find that the charge imbalance of the plasma has a significant effect on the resonant frequency, in excellent agreement with recent predictions suggesting coupling to an edge mode.