RESUMO
We present a series of tools working together that facilitate the determination of dislocation Burgers vectors and slip planes, interface plane normals and misorientation between two crystals from a series of Transmission Electron Microscopy (TEM) micrographs and diffraction patterns. To that purpose, we developed graphical user interface programs that allow crystal orientation determination from spot diffraction patterns taken at various tilt angles or from Kikuchi patterns crystal representation from stereographic projection plots and determination of geometrical features from series of conventional images taken at different tilt angles. We present working examples that allow a faster and easier way to analyse data that can especially be retrieved during in situ straining experiments where dislocations and grain boundaries need to be characterized. More generally, these tools target material scientists interested in daily microstructural characterization in TEM.
RESUMO
This paper presents a new analytical method to determine interface normals from a series of bright/dark field images taken from arbitrary orientations. This approach, based on a general geometrical model of interface projection, provides a generalized formulation of existing methods. It can treat an excessive number of inputs, i.e. orientation conditions. Given 6 or more sets of inputs, even with considerable experimental errors, we prove that this method is still very likely to yield results with satisfactory accuracy. The robustness of the method can thus allow its implementation in problems dealing with a large amount of data. We show that this method can also be applied to determine 1D features or to check the planarity of microstructural features.
