In Operando Neutron Scattering Multiple-Scale Studies of Lithium-Ion Batteries.

Real-time observation of the electrochemical mechanistic behavior at various scales offers new insightful information to improve the performance of lithium-ion batteries (LIBs). As complementary to the X-ray-based techniques and electron microscopy-based methodologies, neutron scattering provides additional and unique advantages in materials research, owing to the different interactions with atomic nuclei. The non-Z-dependent elemental contrast, in addition to the high penetration ability and weak interaction with matters, makes neutron scattering an advanced probing tool for the in operando mechanistic studies of LIBs. The neutron-based techniques, such as neutron powder diffraction, small-angle neutron scattering, neutron reflectometry, and neutron imaging, have their distinct functionalities and characteristics regimes. These result in their scopes of application distributed in different battery components and covering the full spectrum of all aspects of LIBs. The review surveys the state-of-the-art developments of real-time investigation of the dynamic evolutions of electrochemically active compounds at various scales using neutron techniques. The atomic-scale, the mesoscopic-scale, and at the macroscopic-scale within LIBs during electrochemical functioning provide insightful information to battery researchers. The authors envision that this review will popularize the applications of neutron-based techniques in LIB studies and furnish important inspirations to battery researchers for the rational design of the new generation of LIBs.

Elemental Identification by Combining Atomic Force Microscopy and Kelvin Probe Force Microscopy.

There are currently no experimental techniques that combine atomic-resolution imaging with elemental sensitivity and chemical fingerprinting on single molecules. The advent of using molecular-modified tips in noncontact atomic force microscopy (nc-AFM) has made it possible to image (planar) molecules with atomic resolution. However, the mechanisms responsible for elemental contrast with passivated tips are not fully understood. Here, we investigate elemental contrast by carrying out both nc-AFM and Kelvin probe force microscopy (KPFM) experiments on epitaxial monolayer hexagonal boron nitride (hBN) on Ir(111). The hBN overlayer is inert, and the in-plane bonds connecting nearest-neighbor boron and nitrogen atoms possess strong covalent character and a bond length of only ∼1.45 Å. Nevertheless, constant-height maps of both the frequency shift Δ f and the local contact potential difference exhibit striking sublattice asymmetry. We match the different atomic sites with the observed contrast by comparison with nc-AFM image simulations based on the density functional theory optimized hBN/Ir(111) geometry, which yields detailed information on the origin of the atomic-scale contrast.

Elements Provide a Clue: Nanoscale Characterization of Thin-Film Composite Polyamide Membranes.

In this study, we exploit the nitrogen-sulfur elemental contrast of thin-film composite (TFC) polyamide membranes and present, for the first time, the application of two elemental analysis techniques, scanning transmission electron microscopy-energy-dispersive X-ray spectroscopy (STEM-EDX) and X-ray photoelectron spectroscopy (XPS) C60+ ion-beam sputtering, to elucidate the nanoscale structure and chemical composition of the polyamide-polysulfone interface. Although STEM-EDX elemental mapping depicts the presence of a dense polyamide layer at the interface, it is incapable of resolving the elemental contrast at nanoscale resolution at the interfacial zone. Depth-resolved XPS C60+ ion-beam sputtering enabled nanoscale characterization of the polyamide-polysulfone interface and revealed the presence of a heterogeneous layer that contains both polyamide and polysulfone signatures. Our results have important implications for future studies to elucidate the structure-property-performance relationship of TFC membranes.