Application of Electron Microscopes in Nanotoxicity Assessment.

In this chapter, we highlight the applications of electron microscopes (EMs) in nanotoxicity assessment. EMs can provide detailed information about the size and morphology of nanomaterials (NMs), their localization in cells and tissues, the nano-bio interactions, as well as the ultrastructural changes induced by NMs exposure. Here, we share with the readers how we prepare the tissue sample, and the different types of EMs used among the nanotoxicologists. It is possible to deploy conventional EMs along or in combination with other analytical techniques, such as electron energy loss spectroscopy (EELS), energy dispersive X-ray spectroscopy (EDS or EDX), and TEM-assisted scanning transmission X-ray microscopy (STXM), toward further elemental and chemical characterization. Appropriate images are inserted to illustrate throughout this chapter.

Imaging and elemental mapping of biological specimens with a dual-EDS dedicated scanning transmission electron microscope.

A dedicated analytical scanning transmission electron microscope (STEM) with dual energy dispersive spectroscopy (EDS) detectors has been designed for complementary high performance imaging as well as high sensitivity elemental analysis and mapping of biological structures. The performance of this new design, based on a Hitachi HD-2300A model, was evaluated using a variety of biological specimens. With three imaging detectors, both the surface and internal structure of cells can be examined simultaneously. The whole-cell elemental mapping, especially of heavier metal species that have low cross-section for electron energy loss spectroscopy (EELS), can be faithfully obtained. Optimization of STEM imaging conditions is applied to thick sections as well as thin sections of biological cells under low-dose conditions at room and cryogenic temperatures. Such multimodal capabilities applied to soft/biological structures usher a new era for analytical studies in biological systems.

Seeing the atoms more clearly: STEM imaging from the Crewe era to today.

This review covers the development of scanning transmission electron microscopy from the innovations of Albert Crewe to the two-dimensional spectrum imaging in the era of aberration correction. It traces the key events along the path, the first atomic resolution Z-contrast imaging of individual atoms, the realization of incoherent imaging in crystals and the role of dynamical diffraction, simultaneous, atomic resolution electron energy loss spectroscopy, and finally the tremendous impact of the successful correction of lens aberrations, not just in terms of resolution but also in single atom sensitivity.

Capturing the signature of single atoms with the tiny probe of a STEM.

With their first scanning transmission electron microscope (STEM), Albert Crewe and his collaborators have succeeded 40 years ago in bringing to reality a dream for all electron microscopists, to see individual atoms. In the derivation of Crewe's pioneering work, the present review describes various historical and present steps, involving continuous instrumental and methodological developments as well as the preparation of suitable specimens. They have lead to the identification of individual atoms by electron energy-loss spectroscopy (EELS) and to the demonstration of atom-by-atom spectroscopy. Beyond these spectacular successes which open wide fields of use, most recent technical achievements, such as the introduction of monochromators on the incident electron beam or of optical spectrometers for recording spectra (in the visible as well as in the X-ray domain), will undoubtedly lead to refine the accessible signature of single atoms and molecules.

Single-grating monochromator for extreme-ultraviolet ultrashort pulses.

Extreme-ultraviolet high-order-harmonic pulses with 1.6·10(7) photons/pulse at 32.5 eV have been separated from multiple harmonic orders by a time-preserving monochromator using a single grating in the off-plane mount. This grating geometry gives minimum temporal broadening and high efficiency. The pulse duration of the monochromatized harmonic pulses has been measured to be in the range 20 to 30 fs when the harmonic process is driven by an intense 30 fs near-infrared pulse. The harmonic photon energy is tunable between 12 and 120 eV. The instrument is used in the monochromatized branch of the Artemis beamline at the Central Laser Facility (UK) for applications in ultrafast electron spectroscopy.

Practical spatial resolution of electron energy loss spectroscopy in aberration corrected scanning transmission electron microscopy.

The resolution of electron energy loss spectroscopy (EELS) is limited by delocalization of inelastic electron scattering rather than probe size in an aberration corrected scanning transmission electron microscope (STEM). In this study, we present an experimental quantification of EELS spatial resolution using chemically modulated 2×(LaMnO(3))/2×(SrTiO(3)) and 2×(SrVO(3))/2×(SrTiO(3)) superlattices by measuring the full width at half maxima (FWHM) of integrated Ti M(2,3), Ti L(2,3), V L(2,3), Mn L(2,3), La N(4,5), La N(2,3) La M(4,5) and Sr L(3) edges over the superlattices. The EELS signals recorded using large collection angles are peaked at atomic columns. The FWHM of the EELS profile, obtained by curve-fitting, reveals a systematic trend with the energy loss for the Ti, V, and Mn edges. However, the experimental FWHM of the Sr and La edges deviates significantly from the observed experimental tendency.

The development and characteristics of a high-speed EELS mapping system for a dedicated STEM.

A new EELS (electron energy loss spectroscopy) real-time elemental mapping system has been developed for a dedicated scanning transmission electron microscope (STEM). The previous two-window-based jump-ratio system has been improved by a three-window-based system. It is shown here that the three-window imaging method has less artificial intensity in elemental maps than the two-window-based method. Using the new three-window system, the dependence of spatial resolution on the energy window width was studied experimentally and also compared with TEM-based EELS. Here it is shown experimentally that the spatial resolution of STEM-based EELS is independent of the energy window width in a range from 10 eV to 60 eV.

Development of electron energy-loss spectroscopy for nanoscience.

Electron energy-loss spectroscopy (EELS) has been well established in providing the composition and chemical bonding information of materials, particularly for light elements. Its potential for structural determination has long been known but has yet to be fully explored. With the convergence of rapid development in computing power and improvement in the efficiency of the material specific electronic structure simulation, plus the recent breakthrough in the development of C(s)-corrected electron microscopy, the reconstruction of the local three dimensional structure of nanomaterial using EELS in conjunction with advanced structural imaging and diffraction techniques is becoming increasingly feasible. In this paper, we will review from our own examples the progress in EELS instrumentation, methods and simulation to illustrate the progress that has been made. They include the density-function-theory-based ab initio spectroscopic simulation for standard-less fingerprint applications for metastable polymorph identification, magic angle electron energy-loss spectroscopy as well as recent results from the dual-detectors EELS system which allows the energy instability of the spectrometer to be analyzed in real-time and eventually compensated on-line.

Image simulation for electron energy loss spectroscopy.

Aberration correction of the probe forming optics of the scanning transmission electron microscope has allowed the probe-forming aperture to be increased in size, resulting in probes of the order of 1 A in diameter. The next generation of correctors promise even smaller probes. Improved spectrometer optics also offers the possibility of larger electron energy loss spectrometry detectors. The localization of images based on core-loss electron energy loss spectroscopy is examined as function of both probe-forming aperture and detector size. The effective ionization is nonlocal in nature, and two common local approximations are compared to full nonlocal calculations. The affect of the channelling of the electron probe within the sample is also discussed.

New developments in electron energy loss spectroscopy.

In the electron microscope, spectroscopic signals such as the characteristic X-rays or the energy loss of the incident beam can provide an analysis of the local composition or electronic structure. Recent improvements in the energy resolution and sensitivity of electron spectrometers have improved the quality of spectra that can be obtained. Concurrently, the calculations used to simulate and interpret spectra have made major advances. These developments will be briefly reviewed. In recent years, the focus of analytical electron microscopy has moved away from single spectrum acquisition to mapping and imaging. In particular, the use of spectrum imaging (SI), where a full spectrum is acquired and stored at each pixel in the image is becoming widespread. A challenge for the application of spectrum imaging is the processing of such large datasets in order to extract the significant information. When we go beyond the mapping of composition and look to map bonding and electronic structure this becomes both more important and more difficult. Approaches to processing spectrum imaging data sets acquired using electron energy loss spectroscopy (EELS) will be explored in this paper.

A multichannel electron energy loss spectrometer for low-temperature condensed films.

We describe a wide-gap multichannel cylindrical deflection electron energy analyzer suitable for measuring the weak signals characteristic of electronically inelastic electron energy loss spectra. The analyzer has nearly ideal fringing field termination, and its resolution and energy dispersion were characterized as a function of energy by solving numerically the equation of motion of electrons in an ideal cylindrical electric field. The numerical results for the radial location of the electrons at the detector as a function of the entrance location, angle, and energy are closely approximated by a second order polynomial, and match closely with those observed. The detection efficiency of the analyzer is 100-150 times better than that of an equivalent single-channel instrument, but limited energy transmission of the zoom lens system used in our case reduced it by a factor of about 2. The performance of the new instrument was demonstrated by measuring the (3)E(1u) electronic spectrum of benzene in only 2 min and the spectrum of endo-benzotricyclo[4.2.1.0(2.5)]nonane.