Investigation of layered structure SAW devices fabricated using low temperature grown AlN thin film on GaN/sapphire.
IEEE Trans Ultrason Ferroelectr Freq Control
; 52(5): 923-6, 2005 May.
Article
em En
| MEDLINE
| ID: mdl-16048194
Epitaxial AlN films have been grown on GaN/sapphire using helicon sputtering at 300 degrees C. The surface acoustic wave (SAW) filters fabricated on AlN/GaN/sapphire exhibit more superior characteristics than those made on GaN/sapphire. This composite structure of AlN on GaN may bring about the development of high-frequency components, which integrate and use their semiconducting, optoelectronic, and piezoelectric properties.
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01-internacional
Base de dados:
MEDLINE
Idioma:
En
Revista:
IEEE Trans Ultrason Ferroelectr Freq Control
Assunto da revista:
MEDICINA NUCLEAR
Ano de publicação:
2005
Tipo de documento:
Article
País de publicação:
Estados Unidos