Shear force control for a terahertz near field microscope.
Rev Sci Instrum
; 78(11): 113701, 2007 Nov.
Article
em En
| MEDLINE
| ID: mdl-18052474
ABSTRACT
We report on the advancement of apertureless terahertz microscopy by active shear force control of the scanning probe. Extreme subwavelength spatial resolution and a maximized image contrast are achieved by maintaining a tip-surface distance of about 20 nm. The constant distance between scanning tip and surface results in terahertz images that mirror the dielectric permittivity of the surface.
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Coleções:
01-internacional
Base de dados:
MEDLINE
Assunto principal:
Aumento da Imagem
/
Microscopia de Varredura por Sonda
/
Raios Infravermelhos
/
Micro-Ondas
Tipo de estudo:
Diagnostic_studies
Idioma:
En
Revista:
Rev Sci Instrum
Ano de publicação:
2007
Tipo de documento:
Article
País de afiliação:
Alemanha