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Shot noise in ballistic graphene.
Danneau, R; Wu, F; Craciun, M F; Russo, S; Tomi, M Y; Salmilehto, J; Morpurgo, A F; Hakonen, P J.
Afiliação
  • Danneau R; Low Temperature Laboratory, Helsinki University of Technology, Espoo, Finland. r.danneau@boojum.hut.fi
Phys Rev Lett ; 100(19): 196802, 2008 May 16.
Article em En | MEDLINE | ID: mdl-18518472
We have investigated shot noise in graphene field effect devices in the temperature range of 4.2-30 K at low frequency (f=600-850 MHz). We find that for our graphene samples with a large width over length ratio W/L, the Fano factor F reaches a maximum F ~ 1/3 at the Dirac point and that it decreases strongly with increasing charge density. For smaller W/L, the Fano factor at Dirac point is significantly lower. Our results are in good agreement with the theory describing that transport at the Dirac point in clean graphene arises from evanescent electronic states.
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Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Phys Rev Lett Ano de publicação: 2008 Tipo de documento: Article País de afiliação: Finlândia País de publicação: Estados Unidos
Buscar no Google
Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Phys Rev Lett Ano de publicação: 2008 Tipo de documento: Article País de afiliação: Finlândia País de publicação: Estados Unidos