Soft x-ray free electron laser microfocus for exploring matter under extreme conditions.
Opt Express
; 17(20): 18271-8, 2009 Sep 28.
Article
em En
| MEDLINE
| ID: mdl-19907618
ABSTRACT
We have focused a beam (BL3) of FLASH (Free-electron LASer in Hamburg lambda = 13.5 nm, pulse length 15 fs, pulse energy 10-40 microJ, 5 Hz) using a fine polished off-axis parabola having a focal length of 270 mm and coated with a Mo/Si multilayer with an initial reflectivity of 67% at 13.5 nm. The OAP was mounted and aligned with a picomotor controlled six-axis gimbal. Beam imprints on poly(methyl methacrylate) - PMMA were used to measure focus and the focused beam was used to create isochoric heating of various slab targets. Results show the focal spot has a diameter of < or =1 microm. Observations were correlated with simulations of best focus to provide further relevant information.
Texto completo:
1
Coleções:
01-internacional
Base de dados:
MEDLINE
Assunto principal:
Difração de Raios X
/
Teste de Materiais
/
Lasers
/
Lentes
Tipo de estudo:
Diagnostic_studies
Idioma:
En
Revista:
Opt Express
Assunto da revista:
OFTALMOLOGIA
Ano de publicação:
2009
Tipo de documento:
Article
País de afiliação:
Estados Unidos