Soft x-ray spectroscopic investigation of Zn doped CuCl produced by pulsed dc magnetron sputtering.
J Phys Condens Matter
; 25(28): 285501, 2013 Jul 17.
Article
em En
| MEDLINE
| ID: mdl-23778949
ABSTRACT
We report on a systematic investigation of the electronic properties of UV-light emitting Zn doped CuCl thin films implemented using near edge x-ray absorption fine structures (NEXAFS) and high-resolution x-ray photoemission spectroscopy. A clear shift of the valence band maximum towards higher binding energy by 0.2 ± 0.1 eV was observed in Zn doped CuCl as compared to undoped CuCl. This shift is in correlation with the increase in conductivity measured by the Hall effect measurements. A decrease in the optical band gap of CuCl film is also observed as a function of Zn doping. The profound changes in the full width at half maximum and the gradual disappearance of satellite features of Cu 2p core level photoemission as a function of Zn dopant are attributed to the reduced presence of the surface layer of Cu(2+) species with d(9) configuration in the doped films. These investigations help us to understand the doping mechanisms and underlying physics. The reduced presence of the Cu(2+) related surface layer as a function of Zn doping is also verified using NEXAFS.
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1
Coleções:
01-internacional
Base de dados:
MEDLINE
Idioma:
En
Revista:
J Phys Condens Matter
Assunto da revista:
BIOFISICA
Ano de publicação:
2013
Tipo de documento:
Article
País de afiliação:
Irlanda