Comment on "Robust formation of skyrmions and topological Hall effect anomaly in epitaxial thin films of MnSi".

Monchesky, T L; Loudon, J C; Robertson, M D; Bogdanov, A N

Monchesky, T L; Loudon, J C; Robertson, M D; Bogdanov, A N.

Afiliação

Monchesky TL; Department of Physics and Atmospheric Science, Dalhousie University, Halifax, Nova Scotia B3H 3J5, Canada.
Loudon JC; Department of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Road, Cambridge CB3 0FS, United Kingdom.
Robertson MD; Department of Physics, Acadia University, Wolfville, Nova Scotia B4P 2R6, Canada.
Bogdanov AN; IFW Dresden, Postfach 270116, D-01171 Dresden, Germany.

Phys Rev Lett ; 112(5): 059701, 2014 Feb 07.

Article em En | MEDLINE | ID: mdl-24580632

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Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Phys Rev Lett Ano de publicação: 2014 Tipo de documento: Article País de afiliação: Canadá País de publicação: Estados Unidos

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