Your browser doesn't support javascript.
loading
Determining the work function of a carbon-cone cold-field emitter by in situ electron holography.
de Knoop, Ludvig; Houdellier, Florent; Gatel, Christophe; Masseboeuf, Aurélien; Monthioux, Marc; Hÿtch, Martin.
Afiliação
  • de Knoop L; CEMES-CNRS, Université de Toulouse, 29 rue Jeanne Marvig, 31055 Toulouse, France. Electronic address: deknoop@cemes.fr.
  • Houdellier F; CEMES-CNRS, Université de Toulouse, 29 rue Jeanne Marvig, 31055 Toulouse, France. Electronic address: florent@cemes.fr.
  • Gatel C; CEMES-CNRS, Université de Toulouse, 29 rue Jeanne Marvig, 31055 Toulouse, France. Electronic address: gatel@cemes.fr.
  • Masseboeuf A; CEMES-CNRS, Université de Toulouse, 29 rue Jeanne Marvig, 31055 Toulouse, France. Electronic address: aurelien.masseboeuf@cemes.fr.
  • Monthioux M; CEMES-CNRS, Université de Toulouse, 29 rue Jeanne Marvig, 31055 Toulouse, France. Electronic address: marc.monthioux@cemes.fr.
  • Hÿtch M; CEMES-CNRS, Université de Toulouse, 29 rue Jeanne Marvig, 31055 Toulouse, France. Electronic address: martin.hytch@cemes.fr.
Micron ; 63: 2-8, 2014 Aug.
Article em En | MEDLINE | ID: mdl-24702951
ABSTRACT
Cold-field emission properties of carbon cone nanotips (CCnTs) have been studied in situ in the transmission electron microscope (TEM). The current as a function of voltage, i(V), was measured and analyzed using the Fowler-Nordheim (F-N) equation. Off-axis electron holography was employed to map the electric field around the tip at the nanometer scale, and combined with finite element modeling, a quantitative value of the electric field has been obtained. For a tip-anode separation distance of 680 nm (measured with TEM) and a field emission onset voltage of 80 V, the local electric field was 2.55 V/nm. With this knowledge together with recorded i(V) curves, a work function of 4.8±0.3 eV for the CCnT was extracted using the F-N equation.
Palavras-chave

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Micron Assunto da revista: DIAGNOSTICO POR IMAGEM Ano de publicação: 2014 Tipo de documento: Article

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Micron Assunto da revista: DIAGNOSTICO POR IMAGEM Ano de publicação: 2014 Tipo de documento: Article