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First-principles approach to calculating energy level alignment at aqueous semiconductor interfaces.
Kharche, Neerav; Muckerman, James T; Hybertsen, Mark S.
Afiliação
  • Kharche N; Department of Chemistry, Brookhaven National Laboratory, Upton, New York 11973-5000, USA.
  • Muckerman JT; Department of Chemistry, Brookhaven National Laboratory, Upton, New York 11973-5000, USA.
  • Hybertsen MS; Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, New York 11973-5000, USA.
Phys Rev Lett ; 113(17): 176802, 2014 Oct 24.
Article em En | MEDLINE | ID: mdl-25379929
ABSTRACT
A first-principles approach is demonstrated for calculating the relationship between an aqueous semiconductor interface structure and energy level alignment. The physical interface structure is sampled using density functional theory based molecular dynamics, yielding the interface electrostatic dipole. The GW approach from many-body perturbation theory is used to place the electronic band edge energies of the semiconductor relative to the occupied 1b1 energy level in water. The application to the specific cases of nonpolar (101¯0) facets of GaN and ZnO reveals a significant role for the structural motifs at the interface, including the degree of interface water dissociation and the dynamical fluctuations in the interface Zn-O and O-H bond orientations. These effects contribute up to 0.5 eV.
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Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Phys Rev Lett Ano de publicação: 2014 Tipo de documento: Article País de afiliação: Estados Unidos País de publicação: EEUU / ESTADOS UNIDOS / ESTADOS UNIDOS DA AMERICA / EUA / UNITED STATES / UNITED STATES OF AMERICA / US / USA
Buscar no Google
Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Phys Rev Lett Ano de publicação: 2014 Tipo de documento: Article País de afiliação: Estados Unidos País de publicação: EEUU / ESTADOS UNIDOS / ESTADOS UNIDOS DA AMERICA / EUA / UNITED STATES / UNITED STATES OF AMERICA / US / USA