Your browser doesn't support javascript.
loading
Automated data collection in single particle electron microscopy.
Tan, Yong Zi; Cheng, Anchi; Potter, Clinton S; Carragher, Bridget.
Afiliação
  • Tan YZ; The National Resource for Automated Molecular Microscopy, New York Structural Biology Center, New York, NY 10027, USA Simons Electron Microscopy Center, New York Structural Biology Center, 89 Convent Ave, New York, NY 10027, USA Department of Biochemistry and Molecular Biophysics, Columbia Universit
  • Cheng A; The National Resource for Automated Molecular Microscopy, New York Structural Biology Center, New York, NY 10027, USA Simons Electron Microscopy Center, New York Structural Biology Center, 89 Convent Ave, New York, NY 10027, USA.
  • Potter CS; The National Resource for Automated Molecular Microscopy, New York Structural Biology Center, New York, NY 10027, USA Simons Electron Microscopy Center, New York Structural Biology Center, 89 Convent Ave, New York, NY 10027, USA Department of Biochemistry and Molecular Biophysics, Columbia Universit
  • Carragher B; The National Resource for Automated Molecular Microscopy, New York Structural Biology Center, New York, NY 10027, USA Simons Electron Microscopy Center, New York Structural Biology Center, 89 Convent Ave, New York, NY 10027, USA Department of Biochemistry and Molecular Biophysics, Columbia Universit
Microscopy (Oxf) ; 65(1): 43-56, 2016 Feb.
Article em En | MEDLINE | ID: mdl-26671944
Automated data collection is an integral part of modern workflows in single particle electron microscopy (EM) research. This review surveys the software packages available for automated single particle EM data collection. The degree of automation at each stage of data collection is evaluated, and the capabilities of the software packages are described. Finally, future trends in automation are discussed.
Assuntos
Palavras-chave

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Assunto principal: Processamento de Imagem Assistida por Computador / Microscopia Crioeletrônica Idioma: En Revista: Microscopy (Oxf) Ano de publicação: 2016 Tipo de documento: Article País de publicação: Reino Unido

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Assunto principal: Processamento de Imagem Assistida por Computador / Microscopia Crioeletrônica Idioma: En Revista: Microscopy (Oxf) Ano de publicação: 2016 Tipo de documento: Article País de publicação: Reino Unido