Real-time device-scale imaging of conducting filament dynamics in resistive switching materials.

Lee, Keundong; Tchoe, Youngbin; Yoon, Hosang; Baek, Hyeonjun; Chung, Kunook; Lee, Sangik; Yoon, Chansoo; Park, Bae Ho; Yi, Gyu-Chul

Lee, Keundong; Tchoe, Youngbin; Yoon, Hosang; Baek, Hyeonjun; Chung, Kunook; Lee, Sangik; Yoon, Chansoo; Park, Bae Ho; Yi, Gyu-Chul.

Afiliação

Lee K; Department of Physics and Astronomy, Institute of Applied Physics and Research Institute of Advanced Materials (RIAM), Seoul National University, Seoul 151-747, Korea.
Tchoe Y; Department of Physics and Astronomy, Institute of Applied Physics and Research Institute of Advanced Materials (RIAM), Seoul National University, Seoul 151-747, Korea.
Yoon H; Department of Physics and Astronomy, Institute of Applied Physics and Research Institute of Advanced Materials (RIAM), Seoul National University, Seoul 151-747, Korea.
Baek H; Department of Physics and Astronomy, Institute of Applied Physics and Research Institute of Advanced Materials (RIAM), Seoul National University, Seoul 151-747, Korea.
Chung K; Department of Physics and Astronomy, Institute of Applied Physics and Research Institute of Advanced Materials (RIAM), Seoul National University, Seoul 151-747, Korea.
Lee S; Department of Physics, Konkuk University, Seoul, 143-701, Korea.
Yoon C; Department of Physics, Konkuk University, Seoul, 143-701, Korea.
Park BH; Department of Physics, Konkuk University, Seoul, 143-701, Korea.
Yi GC; Department of Physics and Astronomy, Institute of Applied Physics and Research Institute of Advanced Materials (RIAM), Seoul National University, Seoul 151-747, Korea.

Sci Rep ; 6: 27451, 2016 06 07.

Article em En | MEDLINE | ID: mdl-27271792

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Sci Rep Ano de publicação: 2016 Tipo de documento: Article