Non-contact scanning probe technique for electric field measurements based on nanowire field-effect transistor.

Trifonov, A S; Presnov, D E; Bozhev, I V; Evplov, D A; Desmaris, V; Krupenin, V A

Trifonov, A S; Presnov, D E; Bozhev, I V; Evplov, D A; Desmaris, V; Krupenin, V A.

Afiliação

Trifonov AS; Skobeltsyn Institute of Nuclear Physics, Lomonosov Moscow State University, 1(2), Leninskie Gory, GSP-1, Moscow 119991, Russia; Physics Faculty, Lomonosov Moscow State University, Moscow 119991, Russia. Electronic address: trifonov.artem@phys.msu.ru.
Presnov DE; Skobeltsyn Institute of Nuclear Physics, Lomonosov Moscow State University, 1(2), Leninskie Gory, GSP-1, Moscow 119991, Russia; Physics Faculty, Lomonosov Moscow State University, Moscow 119991, Russia.
Bozhev IV; Physics Faculty, Lomonosov Moscow State University, Moscow 119991, Russia.
Evplov DA; AIST-NT Inc, 359 Bel Marin Keys Blvd, Suite 20, Novato, California, 94949, USA.
Desmaris V; Group for Advanced Receiver Development, Department of Earth and Space Science, Chalmers University of Technology, 41296 Göteborg, Sweden.
Krupenin VA; Physics Faculty, Lomonosov Moscow State University, Moscow 119991, Russia.

Ultramicroscopy ; 179: 33-40, 2017 08.

Article em En | MEDLINE | ID: mdl-28388480

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Ultramicroscopy Ano de publicação: 2017 Tipo de documento: Article