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Time-resolved XAFS measurement using quick-scanning techniques at BSRF.
Chu, Shengqi; Zheng, Lirong; An, Pengfei; Gong, Hui; Hu, Tiandou; Xie, Yaning; Zhang, Jing.
Afiliação
  • Chu S; Multi-Discipline Research Center, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, People's Republic of China.
  • Zheng L; Multi-Discipline Research Center, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, People's Republic of China.
  • An P; Multi-Discipline Research Center, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, People's Republic of China.
  • Gong H; Department of Engineering Physics, Tsinghua University, Beijing 100084, People's Republic of China.
  • Hu T; Multi-Discipline Research Center, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, People's Republic of China.
  • Xie Y; Multi-Discipline Research Center, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, People's Republic of China.
  • Zhang J; Multi-Discipline Research Center, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, People's Republic of China.
J Synchrotron Radiat ; 24(Pt 3): 674-678, 2017 05 01.
Article em En | MEDLINE | ID: mdl-28452760
Palavras-chave

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: J Synchrotron Radiat Assunto da revista: RADIOLOGIA Ano de publicação: 2017 Tipo de documento: Article País de publicação: Estados Unidos

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: J Synchrotron Radiat Assunto da revista: RADIOLOGIA Ano de publicação: 2017 Tipo de documento: Article País de publicação: Estados Unidos