Filter-based ultralow-frequency Raman measurement down to 2 cm<sup>-1</sup> for fast Brillouin spectroscopy measurement.

Liu, Xue-Lu; Liu, He-Nan; Wu, Jiang-Bin; Wu, Han-Xu; Zhang, Tao; Zhao, Wei-Qian; Tan, Ping-Heng

Filter-based ultralow-frequency Raman measurement down to 2 cm^-1 for fast Brillouin spectroscopy measurement.

Liu, Xue-Lu; Liu, He-Nan; Wu, Jiang-Bin; Wu, Han-Xu; Zhang, Tao; Zhao, Wei-Qian; Tan, Ping-Heng.

Afiliação

Liu XL; State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China.
Liu HN; State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China.
Wu JB; State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China.
Wu HX; Beijing Key Lab for Precision Optoelectronic Measurement Instrument and Technology, School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, China.
Zhang T; Beijing Key Lab for Precision Optoelectronic Measurement Instrument and Technology, School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, China.
Zhao WQ; Beijing Key Lab for Precision Optoelectronic Measurement Instrument and Technology, School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, China.
Tan PH; State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China.

Rev Sci Instrum ; 88(5): 053110, 2017 May.

Article em En | MEDLINE | ID: mdl-28571441

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Rev Sci Instrum Ano de publicação: 2017 Tipo de documento: Article País de afiliação: China

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