Nanocrystalline copper films are never flat.

Zhang, Xiaopu; Han, Jian; Plombon, John J; Sutton, Adrian P; Srolovitz, David J; Boland, John J

Zhang, Xiaopu; Han, Jian; Plombon, John J; Sutton, Adrian P; Srolovitz, David J; Boland, John J.

Afiliação

Zhang X; School of Chemistry, Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN) and Advanced Materials and Bioengineering Research (AMBER), Trinity College Dublin, Dublin 2, Ireland.
Han J; Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, PA 19104, USA.
Plombon JJ; Components Research, Intel Corporation, Hillsboro, OR 97124, USA.
Sutton AP; Department of Physics, Imperial College London, Exhibition Road, London SW7 2AZ, UK.
Srolovitz DJ; Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, PA 19104, USA.
Boland JJ; Department of Mechanical Engineering and Applied Mechanics, University of Pennsylvania, Philadelphia, PA 19104, USA.

Science ; 357(6349): 397-400, 2017 07 28.

Article em En | MEDLINE | ID: mdl-28751608

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Science Ano de publicação: 2017 Tipo de documento: Article País de afiliação: Irlanda País de publicação: Estados Unidos

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