Critical assessment of charge mobility extraction in FETs.

Choi, Hyun Ho; Cho, Kilwon; Frisbie, C Daniel; Sirringhaus, Henning; Podzorov, Vitaly

Choi, Hyun Ho; Cho, Kilwon; Frisbie, C Daniel; Sirringhaus, Henning; Podzorov, Vitaly.

Afiliação

Choi HH; Department of Physics, Rutgers University, 136 Frelinghuysen Road, Piscataway, New Jersey 08854, USA.
Cho K; Department of Chemical Engineering, Pohang University of Science and Technology (POSTECH), Pohang 37673, South Korea.
Frisbie CD; Department of Chemical Engineering, Pohang University of Science and Technology (POSTECH), Pohang 37673, South Korea.
Sirringhaus H; Department of Chemical Engineering and Materials Science, University of Minnesota, 421 Washington Avenue SE, Minneapolis, Minnesota 55455, USA.
Podzorov V; Cavendish Laboratory, University of Cambridge, JJ Thomson Avenue, Cambridge CB3 0HE, UK.

Nat Mater ; 17(1): 2-7, 2017 12 19.

Article em En | MEDLINE | ID: mdl-29255225

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Nat Mater Assunto da revista: CIENCIA / QUIMICA Ano de publicação: 2017 Tipo de documento: Article País de afiliação: Estados Unidos

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