Publisher Correction: Observation of photobleaching in Ge-deficient Ge<sub>16.8</sub>Se<sub>83.2</sub> chalcogenide thin film with prolonged irradiation.

Zhang, Sen; Chen, Yimin; Wang, Rongping; Shen, Xiang; Dai, Shixun

Publisher Correction: Observation of photobleaching in Ge-deficient Ge_16.8Se_83.2 chalcogenide thin film with prolonged irradiation.

Zhang, Sen; Chen, Yimin; Wang, Rongping; Shen, Xiang; Dai, Shixun.

Afiliação

Zhang S; Laboratory of Infrared Materials and Devices, Ningbo University, Ningbo, Zhejiang, 315211, China.
Chen Y; Key Laboratory of Photoelectric Detection Materials and Devices of Zhejiang Province, Ningbo, 315211, China.
Wang R; Laboratory of Infrared Materials and Devices, Ningbo University, Ningbo, Zhejiang, 315211, China.
Shen X; Key Laboratory of Photoelectric Detection Materials and Devices of Zhejiang Province, Ningbo, 315211, China.
Dai S; University of Chinese Academy of Sciences, Beijing, 100049, China.

Sci Rep ; 8(1): 1671, 2018 01 23.

Article em En | MEDLINE | ID: mdl-29362429

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Sci Rep Ano de publicação: 2018 Tipo de documento: Article País de afiliação: China País de publicação: Reino Unido

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