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High resolution XUV Fourier transform holography on a table top.
Tadesse, G K; Eschen, W; Klas, R; Hilbert, V; Schelle, D; Nathanael, A; Zilk, M; Steinert, M; Schrempel, F; Pertsch, T; Tünnermann, A; Limpert, J; Rothhardt, J.
Afiliação
  • Tadesse GK; Helmholtz-Institute Jena, Fröbelstieg 3, 07743, Jena, Germany.
  • Eschen W; Institute of Applied Physics, Abbe Center of Photonics, Friedrich Schiller University Jena, Albert-Einstein-Straße 15, 07745, Jena, Germany.
  • Klas R; Institute of Applied Physics, Abbe Center of Photonics, Friedrich Schiller University Jena, Albert-Einstein-Straße 15, 07745, Jena, Germany.
  • Hilbert V; Helmholtz-Institute Jena, Fröbelstieg 3, 07743, Jena, Germany.
  • Schelle D; Institute of Applied Physics, Abbe Center of Photonics, Friedrich Schiller University Jena, Albert-Einstein-Straße 15, 07745, Jena, Germany.
  • Nathanael A; Institute of Applied Physics, Abbe Center of Photonics, Friedrich Schiller University Jena, Albert-Einstein-Straße 15, 07745, Jena, Germany.
  • Zilk M; Institute of Applied Physics, Abbe Center of Photonics, Friedrich Schiller University Jena, Albert-Einstein-Straße 15, 07745, Jena, Germany.
  • Steinert M; Institute of Applied Physics, Abbe Center of Photonics, Friedrich Schiller University Jena, Albert-Einstein-Straße 15, 07745, Jena, Germany.
  • Schrempel F; Institute of Applied Physics, Abbe Center of Photonics, Friedrich Schiller University Jena, Albert-Einstein-Straße 15, 07745, Jena, Germany.
  • Pertsch T; Institute of Applied Physics, Abbe Center of Photonics, Friedrich Schiller University Jena, Albert-Einstein-Straße 15, 07745, Jena, Germany.
  • Tünnermann A; Institute of Applied Physics, Abbe Center of Photonics, Friedrich Schiller University Jena, Albert-Einstein-Straße 15, 07745, Jena, Germany.
  • Limpert J; Institute of Applied Physics, Abbe Center of Photonics, Friedrich Schiller University Jena, Albert-Einstein-Straße 15, 07745, Jena, Germany.
  • Rothhardt J; Helmholtz-Institute Jena, Fröbelstieg 3, 07743, Jena, Germany.
Sci Rep ; 8(1): 8677, 2018 Jun 06.
Article em En | MEDLINE | ID: mdl-29875479
ABSTRACT
Today, coherent imaging techniques provide the highest resolution in the extreme ultraviolet (XUV) and X-ray regions. Fourier transform holography (FTH) is particularly unique, providing robust and straightforward image reconstruction at the same time. Here, we combine two important advances First, our experiment is based on a table-top light source which is compact, scalable and highly accessible. Second, we demonstrate the highest resolution ever achieved with FTH at any light source (34 nm) by utilizing a high photon flux source and cutting-edge nanofabrication technology. The performance, versatility and reliability of our approach allows imaging of complex wavelength-scale structures, including wave guiding effects within these structures, and resolving embedded nanoscale features, which are invisible for electron microscopes. Our work represents an important step towards real-world applications and a broad use of XUV imaging in many areas of science and technology. Even nanoscale studies of ultra-fast dynamics are within reach.

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Sci Rep Ano de publicação: 2018 Tipo de documento: Article País de afiliação: Alemanha

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Sci Rep Ano de publicação: 2018 Tipo de documento: Article País de afiliação: Alemanha