Reduction and Increase in Thermal Conductivity of Si Irradiated with Ga<sup>+</sup> via Focused Ion Beam.

Alaie, S; Baboly, M G; Jiang, Y-B; Rempe, S; Anjum, D H; Chaieb, S; Donovan, B F; Giri, A; Szwejkowski, C J; Gaskins, J T; Elahi, M M M; Goettler, D F; Braun, J; Hopkins, P E; Leseman, Z C

Reduction and Increase in Thermal Conductivity of Si Irradiated with Ga⁺ via Focused Ion Beam.

Alaie, S; Baboly, M G; Jiang, Y-B; Rempe, S; Anjum, D H; Chaieb, S; Donovan, B F; Giri, A; Szwejkowski, C J; Gaskins, J T; Elahi, M M M; Goettler, D F; Braun, J; Hopkins, P E; Leseman, Z C.

Afiliação

Alaie S; Department of Radiology, Weill Cornell Medicine , Cornell University , New York , New York 10065 , United States.
Baboly MG; Department of Engineering , University of Jamestown , Jamestown , North Dakota 58405 , United States.
Rempe S; Sandia National Laboratories , Albuquerque , New Mexico 87123 , United States.
Chaieb S; Lawrence Berkeley National Laboratory , Berkeley , California 94720 , United States.
Donovan BF; Materials and Structures Laboratory , Tokyo Institute of Technology , Yokohama 226-8503 , Japan.
Giri A; Department of Physics , United States Naval Academy , Annapolis , Maryland 21402 , United States.

ACS Appl Mater Interfaces ; 10(43): 37679-37684, 2018 Oct 31.

Article em En | MEDLINE | ID: mdl-30280889

Palavras-chave

focused ion beam (FIB); gallium; irradiated; nanostructures; thermal conductivity; time-domain thermoreflectance (TDTR)

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: ACS Appl Mater Interfaces Assunto da revista: BIOTECNOLOGIA / ENGENHARIA BIOMEDICA Ano de publicação: 2018 Tipo de documento: Article País de afiliação: Estados Unidos

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