Multipoint Background Analysis: Gaining Precision and Accuracy in Microprobe Trace Element Analysis.

Allaz, Julien M; Williams, Michael L; Jercinovic, Michael J; Goemann, Karsten; Donovan, John

Allaz, Julien M; Williams, Michael L; Jercinovic, Michael J; Goemann, Karsten; Donovan, John.

Afiliação

Allaz JM; Department of Geological Sciences,University of Colorado Boulder,2200 Colorado Avenue,Boulder,CO 80309-0399,USA.
Williams ML; Department of Geosciences,University of Massachusetts Amherst,611 North Pleasant Street,233 Morrill Science Center,Amherst, MA01003-9297,USA.
Jercinovic MJ; Department of Geosciences,University of Massachusetts Amherst,611 North Pleasant Street,233 Morrill Science Center,Amherst, MA01003-9297,USA.
Goemann K; University of Tasmania,Central Science Laboratory,Dobson Road,Sandy Bay, TAS 7005,Australia.
Donovan J; University of Oregon,CAMCOR, 1443 E. 13th Av., Eugene, OR 97403,USA.

Microsc Microanal ; 25(1): 30-46, 2019 02.

Article em En | MEDLINE | ID: mdl-30744721

Palavras-chave

Bremsstrahlung; electron probe microanalysis; monazite dating; trace element analysis; wavelength-dispersive spectrometry

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Microsc Microanal Ano de publicação: 2019 Tipo de documento: Article País de afiliação: Estados Unidos

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