A systematic method for simulating total ionizing dose effects using the finite elements method.

Chatzikyriakou, Eleni; Potter, Kenneth; de Groot, C H

Chatzikyriakou, Eleni; Potter, Kenneth; de Groot, C H.

Afiliação

Chatzikyriakou E; Department of Electronics and Computer Science, University of Southampton, University Road, Southampton, SO17 1BJ UK.
Potter K; Department of Electronics and Computer Science, University of Southampton, University Road, Southampton, SO17 1BJ UK.
de Groot CH; Department of Electronics and Computer Science, University of Southampton, University Road, Southampton, SO17 1BJ UK.

J Comput Electron ; 16(3): 548-555, 2017.

Article em En | MEDLINE | ID: mdl-32009865

Palavras-chave

Carrier transport; Finite elements method; MOS; Synopsys; Total ionizing dose

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: J Comput Electron Ano de publicação: 2017 Tipo de documento: Article País de publicação: Holanda

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