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Ultrahigh Resolution Thickness Measurement Technique Based on a Hollow Core Optical Fiber Structure.
Wu, Zheyu; Liu, Bin; Zhu, Jiangfeng; Liu, Juan; Wan, Shengpeng; Wu, Tao; Sun, Jinghua.
Afiliação
  • Wu Z; School of Physics and Optoelectronic Engineering, Xidian University, Xi'an 710071, China.
  • Liu B; National Engineering Laboratory for Destructive Testing and Optoelectronic Sensing Technology and Application, Nanchang Hang Kong University, Nanchang 330063, China.
  • Zhu J; School of Physics and Optoelectronic Engineering, Xidian University, Xi'an 710071, China.
  • Liu J; National Engineering Laboratory for Destructive Testing and Optoelectronic Sensing Technology and Application, Nanchang Hang Kong University, Nanchang 330063, China.
  • Wan S; National Engineering Laboratory for Destructive Testing and Optoelectronic Sensing Technology and Application, Nanchang Hang Kong University, Nanchang 330063, China.
  • Wu T; National Engineering Laboratory for Destructive Testing and Optoelectronic Sensing Technology and Application, Nanchang Hang Kong University, Nanchang 330063, China.
  • Sun J; Sch Elect Engn & Intelligentizat, Dongguan University of Technology, Dongguan 523808, China.
Sensors (Basel) ; 20(7)2020 Apr 04.
Article em En | MEDLINE | ID: mdl-32260443
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Sensors (Basel) Ano de publicação: 2020 Tipo de documento: Article País de afiliação: China País de publicação: Suíça
Texto completo
Adicionar na Minha BVS
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Sensors (Basel) Ano de publicação: 2020 Tipo de documento: Article País de afiliação: China País de publicação: Suíça