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Deep-Learning-Enabled Fast Optical Identification and Characterization of 2D Materials.
Han, Bingnan; Lin, Yuxuan; Yang, Yafang; Mao, Nannan; Li, Wenyue; Wang, Haozhe; Yasuda, Kenji; Wang, Xirui; Fatemi, Valla; Zhou, Lin; Wang, Joel I-Jan; Ma, Qiong; Cao, Yuan; Rodan-Legrain, Daniel; Bie, Ya-Qing; Navarro-Moratalla, Efrén; Klein, Dahlia; MacNeill, David; Wu, Sanfeng; Kitadai, Hikari; Ling, Xi; Jarillo-Herrero, Pablo; Kong, Jing; Yin, Jihao; Palacios, Tomás.
Afiliação
  • Han B; Image Processing Center, School of Astronautics, Beihang University, Beijing, 100191, China.
  • Lin Y; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
  • Yang Y; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
  • Mao N; Department of Physics, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
  • Li W; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
  • Wang H; Image Processing Center, School of Astronautics, Beihang University, Beijing, 100191, China.
  • Yasuda K; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
  • Wang X; Department of Physics, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
  • Fatemi V; Department of Physics, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
  • Zhou L; Department of Physics, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
  • Wang JI; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
  • Ma Q; Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
  • Cao Y; Department of Physics, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
  • Rodan-Legrain D; Department of Physics, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
  • Bie YQ; Department of Physics, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
  • Navarro-Moratalla E; Department of Physics, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
  • Klein D; Instituto de Ciencia Molecular, Universidad de Valencia, c/Catedrático José Beltrán 2, Paterna, 46980, Spain.
  • MacNeill D; Department of Physics, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
  • Wu S; Department of Physics, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
  • Kitadai H; Department of Physics, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
  • Ling X; Department of Chemistry and Division of Materials Science and Engineering, Boston University, Boston, MA, 02215, USA.
  • Jarillo-Herrero P; Department of Chemistry and Division of Materials Science and Engineering, Boston University, Boston, MA, 02215, USA.
  • Kong J; Department of Physics, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
  • Yin J; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
  • Palacios T; Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
Adv Mater ; 32(29): e2000953, 2020 Jul.
Article em En | MEDLINE | ID: mdl-32519397
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Diagnostic_studies / Prognostic_studies Idioma: En Revista: Adv Mater Assunto da revista: BIOFISICA / QUIMICA Ano de publicação: 2020 Tipo de documento: Article País de afiliação: China País de publicação: Alemanha
Texto completo
Adicionar na Minha BVS
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Diagnostic_studies / Prognostic_studies Idioma: En Revista: Adv Mater Assunto da revista: BIOFISICA / QUIMICA Ano de publicação: 2020 Tipo de documento: Article País de afiliação: China País de publicação: Alemanha