Dynamical X-ray diffraction imaging of voids in dislocation-free high-purity germanium single crystals.

Gradwohl, Kevin-P; Danilewsky, Andreas N; Roder, Melissa; Schmidbauer, Martin; Janicskó-Csáthy, József; Gybin, Alexander; Abrosimov, Nikolay; Sumathi, R Radhakrishnan

Gradwohl, Kevin-P; Danilewsky, Andreas N; Roder, Melissa; Schmidbauer, Martin; Janicskó-Csáthy, József; Gybin, Alexander; Abrosimov, Nikolay; Sumathi, R Radhakrishnan.

Afiliação

Gradwohl KP; Leibniz-Institut für Kristallzüchtung, Max-Born-Strasse 2, 12489 Berlin, Germany.
Danilewsky AN; Kristallographie, ALU Freiburg, Hermann-Herder-Strasse 5, 79104 Freiburg, Germany.
Roder M; Kristallographie, ALU Freiburg, Hermann-Herder-Strasse 5, 79104 Freiburg, Germany.
Schmidbauer M; Leibniz-Institut für Kristallzüchtung, Max-Born-Strasse 2, 12489 Berlin, Germany.
Janicskó-Csáthy J; Leibniz-Institut für Kristallzüchtung, Max-Born-Strasse 2, 12489 Berlin, Germany.
Gybin A; Leibniz-Institut für Kristallzüchtung, Max-Born-Strasse 2, 12489 Berlin, Germany.
Abrosimov N; Leibniz-Institut für Kristallzüchtung, Max-Born-Strasse 2, 12489 Berlin, Germany.
Sumathi RR; Leibniz-Institut für Kristallzüchtung, Max-Born-Strasse 2, 12489 Berlin, Germany.

J Appl Crystallogr ; 53(Pt 4): 880-884, 2020 Aug 01.

Article em En | MEDLINE | ID: mdl-32788899

Palavras-chave

X-ray topography; diffraction contrast; dislocation density; dynamical theory; high-purity germanium; vacancies; voids

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: J Appl Crystallogr Ano de publicação: 2020 Tipo de documento: Article País de afiliação: Alemanha País de publicação: Estados Unidos

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