Modelling and Evolution of Conducting Filament in TiO<sub><i>x</i></sub> Memristor Using Conducting Atomic Force Microscopy.

Panda, Debashis; Kumari, Roshni; Pradhan, Alaka

Modelling and Evolution of Conducting Filament in TiO_x Memristor Using Conducting Atomic Force Microscopy.

Panda, Debashis; Kumari, Roshni; Pradhan, Alaka.

Afiliação

Panda D; Department of Physics, National Institute of Science and Technology, Orissa, Berhampur 761008, India.
Kumari R; Department of Electrical and Electronics Engineering, National Institute of Science and Technology, Orissa, Berhampur 761008, India.
Pradhan A; Department of Physics, National Institute of Science and Technology, Orissa, Berhampur 761008, India.

J Nanosci Nanotechnol ; 21(3): 1590-1597, 2021 03 01.

Article em En | MEDLINE | ID: mdl-33404422

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: J Nanosci Nanotechnol Ano de publicação: 2021 Tipo de documento: Article País de afiliação: Índia País de publicação: Estados Unidos

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