Identification of Brain Damage after Seizures Using an MR-Based Electrical Conductivity Imaging Method.

Kim, Sanga; Choi, Bup Kyung; Park, Ji Ae; Kim, Hyung Joong; Oh, Tong In; Kang, Won Sub; Kim, Jong Woo; Park, Hae Jeong

Kim, Sanga; Choi, Bup Kyung; Park, Ji Ae; Kim, Hyung Joong; Oh, Tong In; Kang, Won Sub; Kim, Jong Woo; Park, Hae Jeong.

Afiliação

Kim S; Department of Pharmacology, School of Medicine, Kyung Hee University, Seoul 02447, Korea.
Choi BK; Department of Biomedical Engineering, School of Medicine, Kyung Hee University, Seoul 02447, Korea.
Park JA; Division of Applied RI, Korea Institute of Radiological & Medical Science, Seoul 01812, Korea.
Kim HJ; Department of Biomedical Engineering, School of Medicine, Kyung Hee University, Seoul 02447, Korea.
Oh TI; Department of Biomedical Engineering, School of Medicine, Kyung Hee University, Seoul 02447, Korea.
Kang WS; Department of Neuropsychiatry, School of Medicine, Kyung Hee University, Seoul 02447, Korea.
Kim JW; Department of Neuropsychiatry, School of Medicine, Kyung Hee University, Seoul 02447, Korea.
Park HJ; Department of Pharmacology, School of Medicine, Kyung Hee University, Seoul 02447, Korea.

Diagnostics (Basel) ; 11(3)2021 Mar 22.

Article em En | MEDLINE | ID: mdl-33809992

Palavras-chave

N-methyl-D-aspartate; hippocampus; magnetic resonance electrical property tomography; neuronal cell death; seizure

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Diagnostic_studies Idioma: En Revista: Diagnostics (Basel) Ano de publicação: 2021 Tipo de documento: Article País de publicação: Suíça

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