Determination of the embedded electronic states at nanoscale interface via surface-sensitive photoemission spectroscopy.

Wang, Hui-Qiong; Xu, Jiayi; Lin, Xiaoyuan; Li, Yaping; Kang, Junyong; Zheng, Jin-Cheng

Wang, Hui-Qiong; Xu, Jiayi; Lin, Xiaoyuan; Li, Yaping; Kang, Junyong; Zheng, Jin-Cheng.

Afiliação

Wang HQ; Fujian Provincial Key Laboratory of Semiconductors and Applications, Collaborative Innovation Center for Optoelectronic Semiconductors and Efficient Devices, Department of Physics, Xiamen University, Xiamen, 361005, China. hqwang@xmu.edu.cn.
Xu J; Department of Physics, Xiamen University Malaysia, Sepang, 43900, Malaysia. hqwang@xmu.edu.cn.
Lin X; Department of New Energy Science and Engineering, Xiamen University Malaysia, Sepang, 43900, Malaysia. hqwang@xmu.edu.cn.
Li Y; Department of New Energy Science and Engineering, Xiamen University Malaysia, Sepang, 43900, Malaysia.
Kang J; Department of New Energy Science and Engineering, Xiamen University Malaysia, Sepang, 43900, Malaysia.
Zheng JC; Fujian Provincial Key Laboratory of Semiconductors and Applications, Collaborative Innovation Center for Optoelectronic Semiconductors and Efficient Devices, Department of Physics, Xiamen University, Xiamen, 361005, China.

Light Sci Appl ; 10(1): 153, 2021 Jul 27.

Article em En | MEDLINE | ID: mdl-34315859

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Diagnostic_studies Idioma: En Revista: Light Sci Appl Ano de publicação: 2021 Tipo de documento: Article País de afiliação: China País de publicação: Reino Unido

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