Micro-to-nanometer patterning of solution-based materials for electronics and optoelectronics.

Suh, Yo-Han; Shin, Dong-Wook; Chun, Young Tea

Suh, Yo-Han; Shin, Dong-Wook; Chun, Young Tea.

Afiliação

Suh YH; Electrical Engineering Division, Department of Engineering, University of Cambridge 9 JJ Thomson Avenue Cambridge CB3 0FA UK ytc24@cam.ac.uk.
Shin DW; Electrical Engineering Division, Department of Engineering, University of Cambridge 9 JJ Thomson Avenue Cambridge CB3 0FA UK ytc24@cam.ac.uk.
Chun YT; Electrical Engineering Division, Department of Engineering, University of Cambridge 9 JJ Thomson Avenue Cambridge CB3 0FA UK ytc24@cam.ac.uk.

RSC Adv ; 9(65): 38085-38104, 2019 Nov 19.

Article em En | MEDLINE | ID: mdl-35541771

Texto completo

Adicionar na Minha BVS

Imprimir

XML

PubMed Links

Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: RSC Adv Ano de publicação: 2019 Tipo de documento: Article