Technology investigation on time series classification and prediction.

Tong, Yuerong; Liu, Jingyi; Yu, Lina; Zhang, Liping; Sun, Linjun; Li, Weijun; Ning, Xin; Xu, Jian; Qin, Hong; Cai, Qiang

Tong, Yuerong; Liu, Jingyi; Yu, Lina; Zhang, Liping; Sun, Linjun; Li, Weijun; Ning, Xin; Xu, Jian; Qin, Hong; Cai, Qiang.

Afiliação

Tong Y; Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China.
Liu J; Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China.
Yu L; Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China.
Zhang L; Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China.
Sun L; Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China.
Li W; Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China.
Ning X; Shenzhen DAPU Microelectronics Co., Ltd., Shenzhen, China.
Xu J; Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China.
Qin H; Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China.
Cai Q; Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China.

PeerJ Comput Sci ; 8: e982, 2022.

Article em En | MEDLINE | ID: mdl-35634126

Palavras-chave

Classification; Evaluation models; Prediction; Time series analysis

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Prognostic_studies / Risk_factors_studies Idioma: En Revista: PeerJ Comput Sci Ano de publicação: 2022 Tipo de documento: Article País de afiliação: China País de publicação: Estados Unidos

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