Optical determination of layered-materials InSe thickness via RGB contrast method and regression analysis.

Lu, Yi-Ying; Yu, Hsiao-Ching; Wang, You-Xin; Hung, Chih-Keng; Chen, You-Ren; Jhou, Jie; Yen, Peter Tsung-Wen; Hsu, Jui-Hung; Sankar, Raman

Lu, Yi-Ying; Yu, Hsiao-Ching; Wang, You-Xin; Hung, Chih-Keng; Chen, You-Ren; Jhou, Jie; Yen, Peter Tsung-Wen; Hsu, Jui-Hung; Sankar, Raman.

Afiliação

Lu YY; Department of Physics, National Sun Yat-sen University, Kaohsiung 80424, Taiwan.
Yu HC; Department of Physics, National Sun Yat-sen University, Kaohsiung 80424, Taiwan.
Wang YX; Department of Physics, National Sun Yat-sen University, Kaohsiung 80424, Taiwan.
Hung CK; Department of Physics, National Sun Yat-sen University, Kaohsiung 80424, Taiwan.
Chen YR; Department of Physics, National Sun Yat-sen University, Kaohsiung 80424, Taiwan.
Jhou J; Department of Physics, National Sun Yat-sen University, Kaohsiung 80424, Taiwan.
Yen PT; Center for Crystal researches, National Sun Yat-sen University, Kaohsiung 80424, Taiwan.
Hsu JH; Department of Materials and Optoelectronic Science, National Sun Yat-sen University, Kaohsiung 80424, Taiwan.
Sankar R; Institute of Physics, Academia Sinica, Taipei 11529, Taiwan.

Nanotechnology ; 33(48)2022 Sep 09.

Article em En | MEDLINE | ID: mdl-35998580

Palavras-chave

RGB optical contrast; indium selenide; optical microscopy; regression analysis; thickness identification

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Prognostic_studies Idioma: En Revista: Nanotechnology Ano de publicação: 2022 Tipo de documento: Article País de afiliação: Taiwan País de publicação: Reino Unido

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