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Strain Tuning of Negative Capacitance in Ferroelectric KNbO3 Thin Films.
Luo, Yongjian; Wang, Zhen; Chen, Yu; Qin, Minghui; Fan, Zhen; Zeng, Min; Zhou, Guofu; Lu, Xubing; Gao, Xingsen; Chen, Deyang; Liu, Jun-Ming.
Afiliação
  • Luo Y; Guangdong Provincial Key Laboratory of Optical Information Materials and Technology and Institute for Advanced Materials, South China Academy of Advanced Optoelectronics, South China Normal University, Guangzhou 510006, China.
  • Wang Z; Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China.
  • Chen Y; University of Chinese Academy of Sciences, Chinese Academy of Sciences, Beijing 100049, China.
  • Qin M; Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China.
  • Fan Z; Guangdong Provincial Key Laboratory of Optical Information Materials and Technology and Institute for Advanced Materials, South China Academy of Advanced Optoelectronics, South China Normal University, Guangzhou 510006, China.
  • Zeng M; Guangdong Provincial Key Laboratory of Optical Information Materials and Technology and Institute for Advanced Materials, South China Academy of Advanced Optoelectronics, South China Normal University, Guangzhou 510006, China.
  • Zhou G; Guangdong Provincial Key Laboratory of Optical Information Materials and Technology and Institute for Advanced Materials, South China Academy of Advanced Optoelectronics, South China Normal University, Guangzhou 510006, China.
  • Lu X; Guangdong Provincial Key Laboratory of Optical Information Materials and Technology and Institute for Advanced Materials, South China Academy of Advanced Optoelectronics, South China Normal University, Guangzhou 510006, China.
  • Gao X; Guangdong Provincial Key Laboratory of Optical Information Materials and Technology and Institute for Advanced Materials, South China Academy of Advanced Optoelectronics, South China Normal University, Guangzhou 510006, China.
  • Chen D; Guangdong Provincial Key Laboratory of Optical Information Materials and Technology and Institute for Advanced Materials, South China Academy of Advanced Optoelectronics, South China Normal University, Guangzhou 510006, China.
  • Liu JM; Guangdong Provincial Key Laboratory of Optical Information Materials and Technology and Institute for Advanced Materials, South China Academy of Advanced Optoelectronics, South China Normal University, Guangzhou 510006, China.
ACS Appl Mater Interfaces ; 15(13): 16902-16909, 2023 Apr 05.
Article em En | MEDLINE | ID: mdl-36966506
Ferroelectrics with negative capacitance effects can amplify the gate voltage in field-effect transistors to achieve low power operation beyond the limits of Boltzmann's Tyranny. The reduction of power consumption depends on the capacitance matching between the ferroelectric layer and gate dielectrics, which can be well controlled by adjusting the negative capacitance effect in ferroelectrics. However, it is a great challenge to experimentally tune the negative capacitance effect. Here, the observation of the tunable negative capacitance effect in ferroelectric KNbO3 through strain engineering is demonstrated. The magnitude of the voltage reduction and negative slope in polarization-electric field (P-E) curves as the symbol of negative capacitance effects can be controlled by imposing various epitaxial strains. The adjustment of the negative curvature region in the polarization-energy landscape under different strain states is responsible for the tunable negative capacitance. Our work paves the way for fabricating low-power devices and further reducing energy consumption in electronics.
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: ACS Appl Mater Interfaces Assunto da revista: BIOTECNOLOGIA / ENGENHARIA BIOMEDICA Ano de publicação: 2023 Tipo de documento: Article País de afiliação: China País de publicação: Estados Unidos

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: ACS Appl Mater Interfaces Assunto da revista: BIOTECNOLOGIA / ENGENHARIA BIOMEDICA Ano de publicação: 2023 Tipo de documento: Article País de afiliação: China País de publicação: Estados Unidos