Prediction of Cognitive Load from Electroencephalography Signals Using Long Short-Term Memory Network.

Yoo, Gilsang; Kim, Hyeoncheol; Hong, Sungdae

Yoo, Gilsang; Kim, Hyeoncheol; Hong, Sungdae.

Afiliação

Yoo G; Creative Informatics and Computing Institute, Korea University, Seoul 02841, Republic of Korea.
Kim H; College of Informatics, Korea University, Seoul 02841, Republic of Korea.
Hong S; Division of Design, Seokyeong University, Seoul 02713, Republic of Korea.

Bioengineering (Basel) ; 10(3)2023 Mar 15.

Article em En | MEDLINE | ID: mdl-36978752

Palavras-chave

attention mechanism; cognitive load; deep learning; electroencephalography; long short-term memory network

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Prognostic_studies / Risk_factors_studies Idioma: En Revista: Bioengineering (Basel) Ano de publicação: 2023 Tipo de documento: Article

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