A model for excess Johnson noise in superconducting transition-edge sensors.

Wessels, Abigail; Morgan, Kelsey; Gard, Johnathon D; Hilton, Gene C; Mates, John A B; Reintsema, Carl D; Schmidt, Daniel R; Swetz, Daniel S; Ullom, Joel N; Vale, Leila R; Bennett, Douglas A

Wessels, Abigail; Morgan, Kelsey; Gard, Johnathon D; Hilton, Gene C; Mates, John A B; Reintsema, Carl D; Schmidt, Daniel R; Swetz, Daniel S; Ullom, Joel N; Vale, Leila R; Bennett, Douglas A.

Afiliação

Wessels A; University of Colorado, Boulder, Colorado 80309, USA.
Morgan K; National Institute of Standards and Technology, Boulder, Colorado 80305, USA.
Gard JD; University of Colorado, Boulder, Colorado 80309, USA.
Hilton GC; National Institute of Standards and Technology, Boulder, Colorado 80305, USA.
Mates JAB; University of Colorado, Boulder, Colorado 80309, USA.
Reintsema CD; National Institute of Standards and Technology, Boulder, Colorado 80305, USA.
Schmidt DR; National Institute of Standards and Technology, Boulder, Colorado 80305, USA.
Swetz DS; University of Colorado, Boulder, Colorado 80309, USA.
Ullom JN; National Institute of Standards and Technology, Boulder, Colorado 80305, USA.
Vale LR; National Institute of Standards and Technology, Boulder, Colorado 80305, USA.
Bennett DA; National Institute of Standards and Technology, Boulder, Colorado 80305, USA.

Appl Phys Lett ; 118(20)2021.

Article em En | MEDLINE | ID: mdl-37056739

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Prognostic_studies Idioma: En Revista: Appl Phys Lett Ano de publicação: 2021 Tipo de documento: Article País de afiliação: Estados Unidos País de publicação: Estados Unidos

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