Broadband Ultrafast Electron Microscopy Using Electrically Driven Pulse Generation.

Reisbick, Spencer A; Han, Myung-Geun; Liu, Chuhang; Pofelski, Alexandre; Montgomery, Eric; Jing, Chunguang; Zhu, Yimei

Reisbick, Spencer A; Han, Myung-Geun; Liu, Chuhang; Pofelski, Alexandre; Montgomery, Eric; Jing, Chunguang; Zhu, Yimei.

Afiliação

Reisbick SA; Condensed Matter Physics and Materials Science Department, Brookhaven National Laboratory, Upton, NY, USA.
Han MG; Condensed Matter Physics and Materials Science Department, Brookhaven National Laboratory, Upton, NY, USA.
Liu C; Condensed Matter Physics and Materials Science Department, Brookhaven National Laboratory, Upton, NY, USA.
Pofelski A; Department of Physics and Astronomy, Stony Brook University, Stony Brook, NY, USA.
Montgomery E; Condensed Matter Physics and Materials Science Department, Brookhaven National Laboratory, Upton, NY, USA.
Jing C; Euclid Techlabs LLC, 365 Remington Blvd. Bolingbrook, IL, USA.
Zhu Y; Euclid Techlabs LLC, 365 Remington Blvd. Bolingbrook, IL, USA.

Microsc Microanal ; 29(Supplement_1): 1838-1839, 2023 Jul 22.

Article em En | MEDLINE | ID: mdl-37613982

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Microsc Microanal Ano de publicação: 2023 Tipo de documento: Article País de afiliação: Estados Unidos País de publicação: Reino Unido

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