Grain Boundary Plane Measurement Using Transmission Electron Microscopy Automated Crystallographic Orientation Mapping for Atom Probe Tomography Specimens.

Hartshorne, Matthew; Leff, Asher; Vetterick, Gregory; Hopkins, Emily M; Taheri, Mitra L

Hartshorne, Matthew; Leff, Asher; Vetterick, Gregory; Hopkins, Emily M; Taheri, Mitra L.

Afiliação

Hartshorne M; Department of Materials Science and Engineering, Drexel University, 3141 Chestnut St., Philadelphia, PA 19104, USA.
Leff A; Materials and Manufacturing Directorate, Air Force Research Laboratory, 1864 4th St., Wright-Patterson Air Force Base, OH 45433, USA.
Vetterick G; Department of Materials Science and Engineering, Drexel University, 3141 Chestnut St., Philadelphia, PA 19104, USA.
Hopkins EM; United States Army Research Laboratory, 2800 Powder Mill Rd, Adelphi, MD 20783, USA.
Taheri ML; Department of Materials Science and Engineering, Drexel University, 3141 Chestnut St., Philadelphia, PA 19104, USA.

Microsc Microanal ; 29(3): 1018-1025, 2023 Jun 09.

Article em En | MEDLINE | ID: mdl-37749674

Palavras-chave

atom probe tomography; crystallography; electron diffraction; grain boundary plane; transmission electron microscopy

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Microsc Microanal Ano de publicação: 2023 Tipo de documento: Article País de afiliação: Estados Unidos País de publicação: Reino Unido

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