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Stitching Locally Fitted T-Splines for Fast Fitting of Large-Scale Freeform Point Clouds.
Wang, Jian; Bi, Sheng; Liu, Wenkang; Zhou, Liping; Li, Tukun; Macleod, Iain; Leach, Richard.
Afiliação
  • Wang J; State Key Laboratory of Digital Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan 430074, China.
  • Bi S; State Key Laboratory of Digital Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan 430074, China.
  • Liu W; State Key Laboratory of Digital Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan 430074, China.
  • Zhou L; State Key Laboratory of Digital Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan 430074, China.
  • Li T; Centre for Precision Technologies, University of Huddersfield, Huddersfield HD1 3DH, UK.
  • Macleod I; IMA Ltd., 29 Clay Lane, Hale, Cheshire WA15 8PJ, UK.
  • Leach R; Faculty of Engineering, University of Nottingham, Nottingham NG8 1BB, UK.
Sensors (Basel) ; 23(24)2023 Dec 14.
Article em En | MEDLINE | ID: mdl-38139662
ABSTRACT
Parametric splines are popular tools for precision optical metrology of complex freeform surfaces. However, as a promising topologically unconstrained solution, existing T-spline fitting techniques, such as improved global fitting, local fitting, and split-connect algorithms, still suffer the problems of low computational efficiency, especially in the case of large data scales and high accuracy requirements. This paper proposes a speed-improved algorithm for fast, large-scale freeform point cloud fitting by stitching locally fitted T-splines through three steps of localized operations. Experiments show that the proposed algorithm produces a three-to-eightfold efficiency improvement from the global and local fitting algorithms, and a two-to-fourfold improvement from the latest split-connect algorithm, in high-accuracy and large-scale fitting scenarios. A classical Lena image study showed that the algorithm is at least twice as fast as the split-connect algorithm using fewer than 80% control points of the latter.
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Sensors (Basel) Ano de publicação: 2023 Tipo de documento: Article País de afiliação: China

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Sensors (Basel) Ano de publicação: 2023 Tipo de documento: Article País de afiliação: China
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