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Publisher Correction: Polymer-acid-metal quasi-ohmic contact for stable perovskite solar cells beyond a 20,000-hour extrapolated lifetime.
Luo, Junsheng; Liu, Bowen; Yin, Haomiao; Zhou, Xin; Wu, Mingjian; Shi, Hongyang; Zhang, Jiyun; Elia, Jack; Zhang, Kaicheng; Wu, Jianchang; Xie, Zhiqiang; Liu, Chao; Yuan, Junyu; Wan, Zhongquan; Heumueller, Thomas; Lüer, Larry; Spiecker, Erdmann; Li, Ning; Jia, Chunyang; Brabec, Christoph J; Zhao, Yicheng.
Afiliação
  • Luo J; National Key Laboratory of Electronic Films and Integrated Devices, School of Integrated Circuit Science and Engineering, University of Electronic Science and Technology of China, 611731, Chengdu, PR China.
  • Liu B; Institute of Materials for Electronics and Energy Technology (i-MEET), Department of Materials Science, Friedrich-Alexander University Erlangen-Nürnberg, Martensstr. 7, 91058, Erlangen, Germany.
  • Yin H; Shenzhen Institute for Advanced Study, University of Electronic Science and Technology of China, 518110, Shenzhen, PR China.
  • Zhou X; Institute of Materials for Electronics and Energy Technology (i-MEET), Department of Materials Science, Friedrich-Alexander University Erlangen-Nürnberg, Martensstr. 7, 91058, Erlangen, Germany.
  • Wu M; National Key Laboratory of Electronic Films and Integrated Devices, School of Integrated Circuit Science and Engineering, University of Electronic Science and Technology of China, 611731, Chengdu, PR China.
  • Shi H; Institute of Micro- and Nanostructure Research & Center for Nanoanalysis and Electron Microscopy (CENEM), Department of Materials Science, FriedrichAlexander-Universität Erlangen-Nürnberg, Cauerstr. 3, D-91058, Erlangen, Germany.
  • Zhang J; Institute of Micro- and Nanostructure Research & Center for Nanoanalysis and Electron Microscopy (CENEM), Department of Materials Science, FriedrichAlexander-Universität Erlangen-Nürnberg, Cauerstr. 3, D-91058, Erlangen, Germany.
  • Elia J; Institute of Materials for Electronics and Energy Technology (i-MEET), Department of Materials Science, Friedrich-Alexander University Erlangen-Nürnberg, Martensstr. 7, 91058, Erlangen, Germany.
  • Zhang K; Institute of Materials for Electronics and Energy Technology (i-MEET), Department of Materials Science, Friedrich-Alexander University Erlangen-Nürnberg, Martensstr. 7, 91058, Erlangen, Germany.
  • Wu J; Helmholtz-Institute Erlangen-Nürnberg (HI-ERN), Immerwahrstr. 2, 91058, Erlangen, Germany.
  • Xie Z; Institute of Materials for Electronics and Energy Technology (i-MEET), Department of Materials Science, Friedrich-Alexander University Erlangen-Nürnberg, Martensstr. 7, 91058, Erlangen, Germany.
  • Liu C; Institute of Materials for Electronics and Energy Technology (i-MEET), Department of Materials Science, Friedrich-Alexander University Erlangen-Nürnberg, Martensstr. 7, 91058, Erlangen, Germany.
  • Yuan J; Institute of Materials for Electronics and Energy Technology (i-MEET), Department of Materials Science, Friedrich-Alexander University Erlangen-Nürnberg, Martensstr. 7, 91058, Erlangen, Germany.
  • Wan Z; Helmholtz-Institute Erlangen-Nürnberg (HI-ERN), Immerwahrstr. 2, 91058, Erlangen, Germany.
  • Heumueller T; Institute of Materials for Electronics and Energy Technology (i-MEET), Department of Materials Science, Friedrich-Alexander University Erlangen-Nürnberg, Martensstr. 7, 91058, Erlangen, Germany.
  • Lüer L; Institute of Materials for Electronics and Energy Technology (i-MEET), Department of Materials Science, Friedrich-Alexander University Erlangen-Nürnberg, Martensstr. 7, 91058, Erlangen, Germany.
  • Spiecker E; Helmholtz-Institute Erlangen-Nürnberg (HI-ERN), Immerwahrstr. 2, 91058, Erlangen, Germany.
  • Li N; Shenzhen Institute for Advanced Study, University of Electronic Science and Technology of China, 518110, Shenzhen, PR China.
  • Jia C; National Key Laboratory of Electronic Films and Integrated Devices, School of Integrated Circuit Science and Engineering, University of Electronic Science and Technology of China, 611731, Chengdu, PR China. zqwan@uestc.edu.cn.
  • Brabec CJ; Shenzhen Institute for Advanced Study, University of Electronic Science and Technology of China, 518110, Shenzhen, PR China. zqwan@uestc.edu.cn.
  • Zhao Y; Institute of Materials for Electronics and Energy Technology (i-MEET), Department of Materials Science, Friedrich-Alexander University Erlangen-Nürnberg, Martensstr. 7, 91058, Erlangen, Germany.
Nat Commun ; 15(1): 2314, 2024 Mar 14.
Article em En | MEDLINE | ID: mdl-38485958
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Nat Commun Assunto da revista: BIOLOGIA / CIENCIA Ano de publicação: 2024 Tipo de documento: Article País de publicação: Reino Unido
Texto completo
Adicionar na Minha BVS
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XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Nat Commun Assunto da revista: BIOLOGIA / CIENCIA Ano de publicação: 2024 Tipo de documento: Article País de publicação: Reino Unido