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Trade-off analysis between gm/ID and fT of GNR-FETs with single-gate and double-gate device structure.
Ahmad, Md Akram; Kumar, Pankaj; Mech, Bhubon Chandra; Kumar, Jitendra.
Afiliação
  • Ahmad MA; Department of Electronics Engineering, Indian Institutes of Technology, Dhanbad, 826004, India. akram14407@gmail.com.
  • Kumar P; Department of Electronics and Communication Engineering, Graphic Era University, Dehradun, 248002, India.
  • Mech BC; Department of Electronics Engineering, Defence Institute of Advanced Technology, Pune, 411025, India.
  • Kumar J; Department of Electronics Engineering, Indian Institutes of Technology, Dhanbad, 826004, India.
Sci Rep ; 14(1): 10218, 2024 May 03.
Article em En | MEDLINE | ID: mdl-38702353
ABSTRACT
This study examines the operational parameters of field-effect transistors (FETs) using single-gate (SG) and double-gate (DG) graphene nanoribbons (GNRs) within the analog/RF domain. A detailed exploration is conducted through an atomistic pz orbital model, derived from the Hamiltonian of graphene nanoribbons, employing the nonequilibrium Green's function formalism (NEGF) for analysis. The atomic characteristics of the GNRFETs channel are accurately described by utilizing a tight-binding Hamiltonian with an atomistic pz orbital basis set. The primary focus of the analysis revolves around essential analog/RF parameters such as transconductance, transconductance generation factor (TGF), output resistance, early voltage, intrinsic gain, gate capacitance, cut-off frequency, and transit time. Furthermore, the study assesses the gain frequency product (GFP), transfer frequency product (TFP), and gain transfer frequency product (GTFP) to evaluate the balance between transistor efficiency, gain, and cut-off frequency. The research outcomes indicate that double-gate GNRFETs exhibit superior analog/RF performance in comparison to their single-gate counterparts. However, both types of devices demonstrate cut-off frequencies in the gigahertz range. The extensive data presented in this study provides valuable insights into the characteristics of SG and DG GNRFETs, particularly in terms of the figure-of-merit (FoM) for analog/RF performance, offering a comprehensive analysis of the trade-offs in analog applications. In addition, the analysis has been extended be performing a high-performance hybrid 6T static random-access memory (SRAM) to get the impact in their circuit level variation as well as improvement in their circuit performance.
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Sci Rep Ano de publicação: 2024 Tipo de documento: Article País de afiliação: Índia

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Sci Rep Ano de publicação: 2024 Tipo de documento: Article País de afiliação: Índia