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Unraveling electronic origins for boosting thermoelectric performance of p-type (Bi,Sb)2Te3.
Cheng, Rui; Ge, Haoran; Huang, Shengpu; Xie, Sen; Tong, Qiwei; Sang, Hao; Yan, Fan; Zhu, Liangyu; Wang, Rui; Liu, Yong; Hong, Min; Uher, Ctirad; Zhang, Qingjie; Liu, Wei; Tang, Xinfeng.
Afiliação
  • Cheng R; State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology, Wuhan 430070, China.
  • Ge H; State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology, Wuhan 430070, China.
  • Huang S; Institute for Structure and Function and Department of Physics, Chongqing University, Chongqing 400044, China.
  • Xie S; State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology, Wuhan 430070, China.
  • Tong Q; State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology, Wuhan 430070, China.
  • Sang H; State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology, Wuhan 430070, China.
  • Yan F; State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology, Wuhan 430070, China.
  • Zhu L; State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology, Wuhan 430070, China.
  • Wang R; Institute for Structure and Function and Department of Physics, Chongqing University, Chongqing 400044, China.
  • Liu Y; School of Physics and Technology and The Key Laboratory of Artificial Micro/Nano Structures of Ministry of Education, Wuhan University, Wuhan 430072, China.
  • Hong M; Centre for Future Materials, and School of Engineering, University of Southern Queensland, Springfield Central, Brisbane, Queensland 4300, Australia.
  • Uher C; Department of Physics, University of Michigan, Ann Arbor, MI 48109, USA.
  • Zhang Q; State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology, Wuhan 430070, China.
  • Liu W; State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology, Wuhan 430070, China.
  • Tang X; State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology, Wuhan 430070, China.
Sci Adv ; 10(21): eadn9959, 2024 May 24.
Article em En | MEDLINE | ID: mdl-38787957
ABSTRACT
P-type Bi2-xSbxTe3 compounds are crucial for thermoelectric applications at room temperature, with Bi0.5Sb1.5Te3 demonstrating superior performance, attributed to its maximum density-of-states effective mass (m*). However, the underlying electronic origin remains obscure, impeding further performance optimization. Herein, we synthesized high-quality Bi2-xSbxTe3 (00 l) films and performed comprehensive angle-resolved photoemission spectroscopy (ARPES) measurements and band structure calculations to shed light on the electronic structures. ARPES results directly evidenced that the band convergence along the [Formula see text]-[Formula see text] direction contributes to the maximum m* of Bi0.5Sb1.5Te3. Moreover, strategic manipulation of intrinsic defects optimized the hole density of Bi0.5Sb1.5Te3, allowing the extra valence band along [Formula see text]-[Formula see text] to contribute to the electrical transport. The synergy of the above two aspects documented the electronic origins of the Bi0.5Sb1.5Te3's superior performance that resulted in an extraordinary power factor of ~5.5 milliwatts per meter per square kelvin. The study offers valuable guidance for further performance optimization of p-type Bi2-xSbxTe3.

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Sci Adv Ano de publicação: 2024 Tipo de documento: Article País de afiliação: China País de publicação: Estados Unidos

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Sci Adv Ano de publicação: 2024 Tipo de documento: Article País de afiliação: China País de publicação: Estados Unidos