Calibration of a two-color soft x-ray diagnostic for electron temperature measurement.

The two-color soft x-ray (SXR) tomography diagnostic on the Madison Symmetric Torus is capable of making electron temperature measurements via the double-filter technique; however, there has been a 15% systematic discrepancy between the SXR double-filter (SXRDF) temperature and Thomson scattering (TS) temperature. Here we discuss calibration of the Be filters used in the SXRDF measurement using empirical measurements of the transmission function versus energy at the BESSY II electron storage ring, electron microprobe analysis of filter contaminants, and measurement of the effective density. The calibration does not account for the TS and SXRDF discrepancy, and evidence from experiments indicates that this discrepancy is due to physics missing from the SXRDF analysis rather than instrumentation effects.

Note: Effect of photodiode aluminum cathode frame on spectral sensitivity in the soft x-ray energy band.

Silicon photodiodes used for soft x-ray detection typically have a thin metal electrode partially covering the active area of the photodiode, which subtly alters the spectral sensitivity of the photodiode. As a specific example, AXUV4BST photodiodes from International Radiation Detectors have a 1.0 µm thick aluminum frame covering 19% of the active area of the photodiode, which attenuates the measured x-ray signal below ~6 keV. This effect has a small systematic impact on the electron temperature calculated from measurements of soft x-ray bremsstrahlung emission from a high-temperature plasma. Although the systematic error introduced by the aluminum frame is only a few percent in typical experimental conditions on the Madison Symmetric Torus, it may be more significant for other instruments that use similar detectors.

An integrated data analysis tool for improving measurements on the MST RFP.

Many plasma diagnostics contain complementary information. For example, the double-foil soft x-ray system (SXR) and the Thomson Scattering diagnostic (TS) on the Madison Symmetric Torus both measure electron temperature. The complementary information from these diagnostics can be combined using a systematic method based on integrated data analysis techniques, leading to more accurate and sensitive results. An integrated data analysis tool based on Bayesian probability theory was able to estimate electron temperatures that are consistent with both the SXR and TS diagnostics and more precise than either. A Markov Chain Monte Carlo analysis to increase the flexibility of the tool was implemented and benchmarked against a grid search method.

High-performance double-filter soft x-ray diagnostic for measurement of electron temperature structure and dynamics.

A new soft x-ray (SXR) T(e) and tomography diagnostic has been developed for MST that can be used for simultaneous SXR spectrum measurement, tomographically reconstructed emissivity, and reconstructed and line-of-sight electron temperature. The diagnostic utilizes high-performance differential transimpedance amplifiers (gain 10(5)-10(9)) to provide fast time response (up to 125 kHz), allowing for the study of plasma structure dynamics. SXR double-foil T(e) measurements are consistent with Thomson scattering. SXR brightness through a variety of filter thicknesses has been combined with charge exchange recombination spectroscopy (CHERS) impurity density measurements to determine the plasma energy spectrum. Magnetic pickup from the fluctuating magnetic fields in the plasma (B̃∼20 gauss at 10-20 kHz) has been dramatically reduced by improving the detector and housing design, so that nanoampere diode currents are now measured without interference from the substantial fluctuating magnetic field incident on the plasma facing surface of the probe.

A new double-foil soft x-ray array to measure T(e) on the MST reversed field pinch.

A soft x-ray (SXR) diagnostic to measure electron temperature on the Madison Symmetric Torus using two complementary methods is presented. Both methods are based on the double-foil technique, which calculates electron temperature via the ratio of SXR bremsstrahlung emission from the plasma in two different energy ranges. The tomographic emissivity method applies the double-foil technique to a tomographic reconstruction of SXR emissivity, creating a two-dimensional map of temperature throughout the plasma. In contrast, the direct brightness method applies the double-foil technique directly to the measured brightness and generates vertical and horizontal radial profiles. Extensive modeling demonstrates advantages and limitations in both techniques. For example, although the emissivity technique provides a two-dimensional mapping of temperature, its reliance on multiple tomographic inversions introduces some artifacts into the results. On the other hand, the more direct brightness technique avoids these artifacts but is only able to provide a radial profile of electron temperature.